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An interferometric imaging technique can provide time-resolved diagnostics of semiconductor integrated circuits. The semiconductor device is placed in one arm of an interferometer and illuminated with a picosecond pulse from a sub-bandgap infrared la
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::abe58416c84992814cc436e5af080de6
https://doi.org/10.2172/505697
https://doi.org/10.2172/505697
Publikováno v:
Scopus-Elsevier
Summary form only given. An interferometric imaging technique can provide time-resolved diagnostics of semiconductor integrated circuits. The semiconductor device is placed in one arm of an interferometer and illuminated with a picosecond pulse from