Zobrazeno 1 - 5
of 5
pro vyhledávání: '"E. J. DRAUGLIS"'
Publikováno v:
Advanced Ceramic Materials. 3:231-234
The extent of surface oxidation controls the stability of silicon carbide aqueous suspensions. In the present study, x-ray photon spectroscopy (XPS) was used to determine the extent of oxygen on as-received and oxidized silicon carbide whiskers. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::312416f766db5e0571ef38c3227a0710
https://doi.org/10.1111/j.1551-2916.1988.tb00207.x
https://doi.org/10.1111/j.1551-2916.1988.tb00207.x
Publikováno v:
Applied Spectroscopy. 34:219-222
Although there are several spectroscopic techniques for studying solid-air interfaces (which mainly yield information on the solid surface), there are few methods available for studies of solid-liquid interfaces. When the solid is a metal film, the n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::331c732bcac49a8151c23d3aac84441a
https://doi.org/10.1366/0003702804730763
https://doi.org/10.1366/0003702804730763
The purpose of this program is to determine the effects of O2 and H2O on boundary film formation by studing a model system consisting of 2-ethylhexyl sebecate and tricresyl phosphate (TCP) on ARMCO iron surfaces. This report deals with the first year
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2e2fcc73c8bbb7082bb419a22933cfb
https://doi.org/10.21236/ada058873
https://doi.org/10.21236/ada058873
Autor:
L. E. Vaaler, R. E. Schwerzel, E. W. Brooman, E. J. Drauglis, V. E. Wood, D. D. Levy, H. J. Byker
Publikováno v:
ACS Symposium Series ISBN: 9780841206045
Photoeffects at Semiconductor-Electrolyte Interfaces
Photoeffects at Semiconductor-Electrolyte Interfaces
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b18225979b0e157437abefbedda0de2
https://doi.org/10.1021/bk-1981-0146.ch012
https://doi.org/10.1021/bk-1981-0146.ch012
Autor:
ARTHUR J. NOZIK, HEINZ GERISCHER, H. J. LEWERENZ, A. HELLER, H. J. LEAMY, S. D. FERRIS, NATHAN S. LEWIS, MARK S. WRIGHTON, ADAM HELLER, D. S. GINLEY, M. A. BUTLER, R. H. WILSON, W. P. GOMES, F. VAN OVERMEIRE, D. VANMAEKELBERGH, F. VANDEN KERCHOVE, F. CARDON, HIDEO TAMURA, HIROSHI YONEYAMA, TETSUHIKO KOBAYASHI, Y. NAKATO, A. TSUMURA, H. TSUBOMURA, F. T. WAGNER, S. FERRER, G. A. SOMORJAI, S. ROY MORRISON, MARC J. MADOU, KARL W. FRESE, R. E. SCHWERZEL, E. W. BROOMAN, H. J. BYKER, E. J. DRAUGLIS, D. D. LEVY, L. E. VAALER, V. E. WOOD, K. DWIGHT, A. WOLD, JOHN G. MAVROIDES, JOHN C. FAN, HERBERT J. ZEIGER, TSUTOMU MIYASAKA, KENICHI HONDA, J. A. TURNER, J. MANASSEN, A. J. NOZIK, MICHA TOMKIEWICZ, JOSEPH K. LYDEN, R. P. SILBERSTEIN, FRED H. POLLAK, JOHN E. BULKOWSKI, RANDY A. BULL, STEVEN R. SAUERBRUNN, ARTHUR B. ELLIS, BRADLEY R. KARAS, HAROLD E. HAGER, MARYE ANNE FOX, ROBERT C. OWEN, R. J. GALE, P. SMITH, P. SINGH, K. RAJESHWAR, J. DUBOW, JOSEPH REICHMAN, MICHAEL A. RUSSAK, DAVID CAHEN, GARY HODES, JOOST MANASSEN, RESHEF TENNE, PETER G. P. ANG, ANTHONY F. SAMME