Zobrazeno 1 - 10
of 35
pro vyhledávání: '"E. Huwald"'
Akademický článek
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Autor:
Mark T. Edmonds, Jimmy C. Kotsakidis, Kevin M. Daniels, Anton Tadich, D. Kurt Gaskill, Michael S. Fuhrer, J.D. Riley, Iolanda Di Bernardo, Sean Solari, Antonija Grubišić-Čabo, Yuefeng Yin, Rachael L. Myers-Ward, Matthew Haldon, Nikhil V. Medhekar, E. Huwald
We use angle-resolved photoemission spectroscopy to investigate the electronic structure of bilayer graphene at high n-doping and extreme displacement fields, created by intercalating epitaxial monolayer graphene on silicon carbide with magnesium to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::695edbc4d6fad89bd6a608e8fd1b1284
http://arxiv.org/abs/2005.02670
http://arxiv.org/abs/2005.02670
Autor:
Chutian Wang, E. Huwald, Jack Hellerstedt, Sung-Kwan Mo, Michael S. Fuhrer, Shujie Tang, Anton Tadich, Antonija Grubišić-Čabo, J.D. Riley, Mark T. Edmonds, James L. Collins, Changxi Zheng, Nikhil V. Medhekar, Yuefeng Yin
Layered indium selenides ($In_{2}Se_{3}$) have recently been discovered to host robust out-of-plane and in-plane ferroelectricity in the $\alpha$ and $\beta$' phases, respectively. In this work, we utilise angle-resolved photoelectron spectroscopy to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f1685465e30b33187acfc9cd586a329b
http://arxiv.org/abs/1910.05969
http://arxiv.org/abs/1910.05969
Publikováno v:
Scientific Reports
The elastic properties of materials, either under external load or in a relaxed state, influence their mechanical behaviour. Conventional optical approaches based on techniques such as photoelasticity or thermoelasticity can be used for full-field an
Akademický článek
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Autor:
Martin Franz, G. Pruskil, J.D. Riley, E. Huwald, B. Höpfner, Christopher Prohl, M. Vetterlein, I. Engelhardt, M. Wanke, Mario Dähne, P. Stojanov
Publikováno v:
Surface Science. 603:2808-2814
We report on angle-resolved photoelectron spectroscopy results of thin dysprosium-silicide layers formed on Si(1 1 1), taken with a toroidal analyzer allowing to image the energy surfaces in k||-space. At monolayer dysprosium coverages, where hexagon
Autor:
Konstantin V. Emtsev, Anton Tadich, Lothar Ley, J.D. Riley, L. Broekman, R.C.G. Leckey, Thomas Seyller, E. Huwald
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. :1001-1004
A second generation toroidal electron spectrometer is briefly described and results presented that demonstrate its capabilities. Band structure measurements obtained from graphitised SiC (0 0 0 1) and X-ray photoelectron diffraction results from Cu (
Autor:
Anton Tadich, L. Broekman, R.C.G. Leckey, J.D. Riley, Thomas Seyller, Konstantin V. Emtsev, Lothar Ley, E. Huwald
Publikováno v:
Materials Science Forum. :547-550
We have investigated Si-rich reconstructions of 4H-SiC( 00 1 1 ) surfaces by means of low-energy electron diffraction (LEED), x-ray photoelectron spectroscopy (XPS), and angleresolved ultraviolet photoelectron spectroscopy (ARUPS). The reconstruction
Autor:
A. Tadich, J. Riley, E. Huwald, R. Leckey, T. Seyller, L. Ley, R. Garrett, I. Gentle, K. Nugent, S. Wilkins
Publikováno v:
AIP Conference Proceedings.
An overview is provided of a next‐generation toroidal angle‐resolving photoemission spectrometer, currently in operation at BESSY II. The instrument features exceptional multi‐detection in energy and angle, facilitating rapid full‐hemisphere
Autor:
Alexander M. Shikin, Oliver Rader, Anton Tadich, J.D. Riley, R.C.G. Leckey, W. Gudat, E. Huwald, Hiroshi Daimon, Hiroaki Miyata, L. Broekman, H. Wolf, Fumihiko Matsui
Publikováno v:
Physical Review B. 79
One of the fundamental properties of an electronic system is its dimensionality. Novel photoemission apparatuses enable a direct determination of the Fermi surface of metals in all three dimensions but the data obtained from transition-metal monolaye