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Autor:
E. Grünbaum, Keith W. J. Barnham, Peter R. Wilshaw, Massimo Mazzer, Nicholas J. Ekins-Daukes, Yoram Shapira, D.B. Bushnell, Zahava Barkay
Publikováno v:
Springer Proceedings in Physics ISBN: 9783540319146
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The method of ionisation potential (dopant contrast) microscopy in the HRSEM is applied to the study of the electric field distribution in p-i-n structures used as quantum well solar cells. Our results show a secondary electron signal which varies be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cfd0e679e0324a5a2a260ec0ef101efa
https://ora.ox.ac.uk/objects/uuid:d4a6a4fa-614d-4ce4-b7d6-ebdddf8f715e
https://ora.ox.ac.uk/objects/uuid:d4a6a4fa-614d-4ce4-b7d6-ebdddf8f715e
Publikováno v:
Journal of Applied Physics. 73:7585-7590
We studied the influence of substrate defects on the morphological and transport properties of Y1Ba2Cu3O7−x high Tc superconducting thin films. The substrate defects were characterized by dispersive and nondispersive cathodoluminescence in the scan
Publikováno v:
Physica C: Superconductivity. 209:81-84
We used cathodoluminescence (CL) in the Scanning Electron Microscope (SEM) for studying different superconducting properties. CL measurements were used to reveal and identify non-superconducting phases which existed in the Y1Ba2Cu3O6+X (YBCO) high Tc
Autor:
E. Grünbaum, Massimo Mazzer, Nicholas J. Ekins-Daukes, Keith W. J. Barnham, Peter R. Wilshaw, Zahava Barkay, Yoram Shapira, D.B. Bushnell
Publikováno v:
Microscopy and microanalysis (Internet) 15 (2009): 125–129. doi:10.1017/S1431927609090205
info:cnr-pdr/source/autori:Enrique Grunbaum, Zahava Barkay, Yoram Shapira, Keith W.J. Barnham, David B. Bushnell, Nicholas J. Ekins-Daukes, Massimo Mazzer and Peter Wilshaw/titolo:Secondary Electron Emission Contrast of Quantum Wells in GaAs pin Junctions/doi:10.1017%2FS1431927609090205/rivista:Microscopy and microanalysis (Internet)/anno:2009/pagina_da:125/pagina_a:129/intervallo_pagine:125–129/volume:15
info:cnr-pdr/source/autori:Enrique Grunbaum, Zahava Barkay, Yoram Shapira, Keith W.J. Barnham, David B. Bushnell, Nicholas J. Ekins-Daukes, Massimo Mazzer and Peter Wilshaw/titolo:Secondary Electron Emission Contrast of Quantum Wells in GaAs pin Junctions/doi:10.1017%2FS1431927609090205/rivista:Microscopy and microanalysis (Internet)/anno:2009/pagina_da:125/pagina_a:129/intervallo_pagine:125–129/volume:15
The secondary electron (SE) signal over a cleaved surface of GaAs p-i-n solar cells containing stacks of quantum wells (QWs) is analyzed by high-resolution scanning electron microscopy. The InGaAs QWs appear darker than the GaAsP barriers, which is a
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 9:2642-2647
Ge(100) single‐crystal films, up to 30 μm thick, have been obtained by molecular‐beam epitaxy (MBE) on a CaF2(100) or BaF2(100) single‐crystal film substrate, 2000 A thick, grown in turn by MBE on a sapphire (1102) single‐crystal wafer. By d
Publikováno v:
Applied Surface Science. :535-539
Thin films, 800–2000Athick, of single-crystal (100) sphalerite CdS, which were grown epitaxially on single-crystal (100) NaCl substrates and possessed a density of 1012–13 defects/cm2, were converted toCuxS by dipping them in a hot CuCl solution.
Publikováno v:
Vacuum. 41:847-850
Single-crsytal CaF 2 and BaF 2 films are being used as intermediate substrates for the epitaxial growth of single-crystal semiconductors (Ge and GaAs) films. p-jununctions in these films serve as solar cells. By dissolving the CaF 2 or BaF 2 in water
Publikováno v:
Applied Physics Letters. 61:3050-3052
Spectral cathodoluminescence (CL) of the Y1Ba2Cu3O7−δ high Tc superconducting pellet and its related components (Y2O3, BaCO3, CuO) was studied in the scanning electron microscope (SEM). Characteristic CL spectra of the Y1Ba2Cu3O7−δ component ph
Autor:
J. Azoulay, N. Hess, Guy Deutscher, Uri Dai, E. Grünbaum, Zahava Barkay, Yossi Lereah, D. Racah
Publikováno v:
Applied Physics Letters. 57:1808-1810
Cathodoluminescence (CL) of thin films of high Tc superconductors was studied in the scanning electron microscope. The depth and the lateral locations of the different phases can be revealed. In thin films, unlike the bulk superconductors, the CL inf