Zobrazeno 1 - 10
of 121
pro vyhledávání: '"E. F. Venger"'
Autor:
L. O. Matveeva, E. F. Venger, R. V. Konakova, O. Yu. Kolyadina, P. L. Neluba, V. V. Shynkarenko
Publikováno v:
Фізика і хімія твердого тіла, Vol 18, Iss 2, Pp 173-179 (2018)
The results of a complex study of C60/Si heterosystems are presented in this work: the crystal structure and composition of the films, internal mechanical stresses, electronic parameters of the film and the film-substrate interface, and the effect of
Externí odkaz:
https://doaj.org/article/4cb6b869efe14d57a9f7425bddcc31b9
Publikováno v:
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 5-6, Pp 10-15 (2020)
Despite the large number of scientific articles devoted to the development of cryogenic resistance thermometers, not many of these thermometers are mass-produced. As is know, semiconductor resistive temperature sensors have low magnetoresistance and
Publikováno v:
Semiconductor Physics, Quantum Electronics & Optoelectronics, Vol 21, Iss 4, Pp 417-423 (2018)
Properties of thin films of ternary alloys Mg х Zn 1–х O on the optically-anisotropic Al 2 O 3 substrates in the area of “residual rays” of film and substrate are first investigated using the method of infrared spectroscopy and dispersion ana
Autor:
L. Melnichuk, Larysa Khomenkova, L. V. Borkovska, Christophe Labbé, O. Korsunska, Xavier Portier, O. Melnichuk, C. Guillaume, Tetyana Kryshtab, O.F. Kolomys, E. F. Venger, T. Sabov, V. V. Strelchuk
Publikováno v:
Thin Solid Films
Thin Solid Films, 2019, 692, pp.137634. ⟨10.1016/j.tsf.2019.137634⟩
Thin Solid Films, Elsevier, 2019, 692, pp.137634. ⟨10.1016/j.tsf.2019.137634⟩
Thin Solid Films, 2019, 692, pp.137634. ⟨10.1016/j.tsf.2019.137634⟩
Thin Solid Films, Elsevier, 2019, 692, pp.137634. ⟨10.1016/j.tsf.2019.137634⟩
International audience; The influence of rapid thermal annealing (RTA) on structural and optical properties of ZnO multilayer structures co-doped with Tb and Eu ions has been investigated by X-ray diffraction, Time-of-Fligth Secondary Ion Mass Spectr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fc83be6952b947612f00a69109c03969
https://hal.science/hal-02438873
https://hal.science/hal-02438873
Autor:
K. V. Shportko, E. F. Venger
Publikováno v:
Applied Nanoscience. 9:1127-1131
The influence of disorder at the dielectric constant, as well as at the position of absorption edge in CdP2 has been investigated. The dielectric constant and position of optical absorption edge for the samples with a high concentration of cadmium an
Autor:
V. P. Kladko, Nadiia Korsunska, N. P. Baran, Yu. Yu. Bacherikov, S. V. Kozitskii, E. F. Venger, Yu. O. Polishchuk, Igor Vorona, A. G. Zhuk, A.V. Gilchuk, S. R. Lavorik
Publikováno v:
Journal of Materials Science: Materials in Electronics. 28:8569-8578
The influence of Zn/S ratio in the charge on structural and optical properties of ZnS:Mn powders produced by high-temperature self-propagated synthesis was investigated. The samples was shown to consist of mixed-polytypes ZnS crystallites with hexago
Publikováno v:
Ukrainian Journal of Physics. 61:1053-1060
Publikováno v:
Vibrational Spectroscopy. 87:173-181
Raman spectroscopy has proven to be a widely used tool for investigation the vibrational properties of diphosphides ZnP 2 and CdP 2 over a wide range of temperature change. The temperature dependence of the vibrational modes in the diphosphides ZnP 2
Publikováno v:
Current Applied Physics. 16:8-11
Zinc diphosphide Zn 3 P 2 is promising material for photovoltaic applications due to its physical properties. In this study dispersion of the surface polaritons ν s (k) in Zn 3 P 2 has been investigated at 10 and 300 K. Surface polaritons were excit
Publikováno v:
Ukrainian Journal of Physics. 65:162
Specular infrared reflection spectra in the range of “residual rays” of the film and the substrate and in the case of the E⊥c orientation of the electric field have been simulated for the first time for thin MgxZn1−xO films deposited on optic