Zobrazeno 1 - 6
of 6
pro vyhledávání: '"E. E. Sheremet"'
Publikováno v:
Geofizicheskiy Zhurnal; Том 36, № 2 (2014); 35-56
Геофизический журнал; Том 36, № 2 (2014); 35-56
Геофізичний журнал; Том 36, № 2 (2014); 35-56
Геофизический журнал; Том 36, № 2 (2014); 35-56
Геофізичний журнал; Том 36, № 2 (2014); 35-56
On the base of French-Ukrainian collaboration (DARIUS program), in the eastern part of the Crimea Mountain the first stage of field work was performed, during which the samples of flysch rocks were taken for micropaleontological analysis (Nanofossils
Publikováno v:
Geotectonics
Geotectonics, MAIK Nauka/Interperiodica, 2016, 50 (4), pp.407-427
Geotectonics, MAIK Nauka/Interperiodica, 2016, 50 (4), pp.407-427
International audience; Extended along the Crimea–Caucasus coast of the Black Sea, the Crimean Seismic Zone (CSZ) is an evidence of active tectonic processes at the junction of the Scythian Plate and Black Sea Microplate. A relocation procedure app
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::205f6b8ddaf9f6e9e5ef43da8645266a
https://hal.archives-ouvertes.fr/hal-02148606
https://hal.archives-ouvertes.fr/hal-02148606
Autor:
Murastov G; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Bogatova E; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Brazovskiy K; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Amin I; Van't Hoff Institute of Molecular Science, University of Amsterdam, Science Park 904, 1098XH, Amsterdam, Netherlands., Lipovka A; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Dogadina E; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Cherepnyov A; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Ananyeva A; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Plotnikov E; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia., Ryabov V; Cardiology Research Institute, Tomsk National Research Medical Center, 111a Kievskaya Street 634012, Tomsk National Research Tomsk State University, 36 Lenina ave 634050, Siberian State Medical University, 2 Moscovskiy trakt, 634050, Tomsk, Russia., Rodriguez RD; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia. Electronic address: raul@tpu.ru., Sheremet E; Tomsk Polytechnic University, Lenina ave. 30, 634034, Tomsk, Russia. Electronic address: esheremet@tpu.ru.
Publikováno v:
Biosensors & bioelectronics [Biosens Bioelectron] 2020 Oct 15; Vol. 166, pp. 112426. Date of Electronic Publication: 2020 Jul 11.
Autor:
Sheremet E; Tomsk Polytechnic University, 30 Lenin Ave, 634050 Tomsk, Russia., Kim L; Tomsk Polytechnic University, 30 Lenin Ave, 634050 Tomsk, Russia., Stepanichsheva D; Tomsk Polytechnic University, 30 Lenin Ave, 634050 Tomsk, Russia., Kolchuzhin V; Qorvo Munich GmbH, Konrad-Zuse-Platz 1, D-81829 Munich, Germany; Chemnitz University of Technology, D-09107 Chemnitz, Germany., Milekhin A; Rzhanov Institute of Semiconductor Physics of the Siberian Branch of the RAS, 630090 Novosibirsk, Russia., Zahn DRT; Chemnitz University of Technology, D-09107 Chemnitz, Germany., Rodriguez RD; Tomsk Polytechnic University, 30 Lenin Ave, 634050 Tomsk, Russia. Electronic address: raul@tpu.ru.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2019 Nov; Vol. 206, pp. 112811. Date of Electronic Publication: 2019 Jul 04.
Autor:
Sheremet E; Semiconductor Physics, Technische Universität Chemnitz, D-09107 Chemnitz, Germany. evgeniya.sheremet@physik.tu-chemnitz.de., Milekhin AG, Rodriguez RD, Weiss T, Nesterov M, Rodyakina EE, Gordan OD, Sveshnikova LL, Duda TA, Gridchin VA, Dzhagan VM, Hietschold M, Zahn DR
Publikováno v:
Physical chemistry chemical physics : PCCP [Phys Chem Chem Phys] 2015 Sep 07; Vol. 17 (33), pp. 21198-203. Date of Electronic Publication: 2015 Jan 07.
Autor:
Rodriguez RD; Semiconductor Physics, Chemnitz University of Technology, D-09107 Chemnitz, Germany., Sheremet E, Müller S, Gordan OD, Villabona A, Schulze S, Hietschold M, Zahn DR
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2012 Dec; Vol. 83 (12), pp. 123708.