Zobrazeno 1 - 10
of 76
pro vyhledávání: '"E. C. Cosgriff"'
Aberration correction leads to reduced focal depth of field in the electron microscope. This reduced depth of field can be exploited to probe specific depths within a sample, a process known as optical sectioning. An electron microscope fitted with a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03d5c67149abcf41ca4e2491562aaf76
https://ora.ox.ac.uk/objects/uuid:aad404c5-b2d5-4522-8161-3857b3e5267e
https://ora.ox.ac.uk/objects/uuid:aad404c5-b2d5-4522-8161-3857b3e5267e
Autor:
Angus I. Kirkland, Leslie J. Allen, Peng Wang, Peter D. Nellist, Adrian J. D’Alfonso, E. C. Cosgriff, Scott D. Findlay, G. Behan
The mechanism of image contrast formation in aberration-corrected scanning confocal electron microscopy (SCEM) is studied. Studies of image formation mechanism in high-resolution SCEM have been based on the application of a linear imaging theory from
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6cfd0310500ff5cb6913224fe57b4183
https://ora.ox.ac.uk/objects/uuid:d12b0fc3-f53e-45ca-8bc5-4c452beef79a
https://ora.ox.ac.uk/objects/uuid:d12b0fc3-f53e-45ca-8bc5-4c452beef79a
Autor:
Leslie J. Allen, G. Behan, Adrian J. D’Alfonso, Peter D. Nellist, E. C. Cosgriff, Scott D. Findlay, Angus I. Kirkland
Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b220f16568fca9d4af784e182c9916a5
https://ora.ox.ac.uk/objects/uuid:d5c88eb2-e1bd-4079-b066-5e571cbf771f
https://ora.ox.ac.uk/objects/uuid:d5c88eb2-e1bd-4079-b066-5e571cbf771f
Publikováno v:
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547
High resolution electron microscopy (HREM) of crystals is usually carried out with the crystal aligned along a high symmetry direction. For perfect crystals the columns are straight, but crystal defects can result in strain fields that bend the atomi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fd85b8a9477cec78a8cea9c278f44dcf
https://ora.ox.ac.uk/objects/uuid:c1f8f966-a855-4a97-9438-82a5722a7afe
https://ora.ox.ac.uk/objects/uuid:c1f8f966-a855-4a97-9438-82a5722a7afe
Autor:
Scott D. Findlay, E. C. Cosgriff, Leslie J. Allen, Adrian J. D’Alfonso, Gary Ruben, James M. LeBeau
Publikováno v:
Ultramicroscopy. 113:131-138
We investigate the application of a highly convergent aberration-corrected electron probe to the determination of depth-related features of layered heterostructures. By centring the probe upon an atomic column and varying defocus, we obtain a depth-s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e5e59f17f2c2f49e21d157b8571f6cc6
https://doi.org/10.1016/j.ultramic.2011.11.002
https://doi.org/10.1016/j.ultramic.2011.11.002
Autor:
Adrian J. D’Alfonso, Ayako Hashimoto, Kazutaka Mitsuishi, G. Behan, E. C. Cosgriff, Peng Wang, Angus I. Kirkland, Peter D. Nellist, Masaki Takeguchi, Masayuki Shimojo, Andrew J. Morgan, Leslie J. Allen
Publikováno v:
Ultramicroscopy. 111:877-886
Scanning confocal electron microscopy (SCEM) offers a mechanism for three-dimensional imaging of materials, which makes use of the reduced depth of field in an aberration-corrected transmission electron microscope. The simplest configuration of SCEM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d40085d5948fabbf8b9ed789abc5f11
https://doi.org/10.1016/j.ultramic.2010.10.012
https://doi.org/10.1016/j.ultramic.2010.10.012
Publikováno v:
Philosophical Magazine. 90:4361-4375
This paper presents annular dark-field scanning transmission electron microscope image simulations of a screw dislocation viewed end-on in a thin single crystal of Mo, taking into account surface relaxation (the Eshelby twist). The image contrast can
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b32ab94de403694a5a26af52b8eecebb
https://doi.org/10.1080/14786435.2010.505183
https://doi.org/10.1080/14786435.2010.505183
Publikováno v:
Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences. 367:3825-3844
The depth resolution for optical sectioning in the scanning transmission electron microscope is measured using the results of optical sectioning experiments of laterally extended objects. We show that the depth resolution depends on the numerical ape
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9528ae2ca87a0d3588f00ef7f06b113f
https://doi.org/10.1098/rsta.2009.0074
https://doi.org/10.1098/rsta.2009.0074
Autor:
Angus I. Kirkland, Scott D. Findlay, Peter D. Nellist, E. C. Cosgriff, Adrian J. D’Alfonso, Leslie J. Allen
Publikováno v:
Ultramicroscopy. 108:1558-1566
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d930ffbb21de2f32f0fa61d60c3f492e
https://doi.org/10.1016/j.ultramic.2008.05.009
https://doi.org/10.1016/j.ultramic.2008.05.009
Autor:
Scott D. Findlay, Angus I. Kirkland, Peter D. Nellist, Leslie J. Allen, Adrian J. D’Alfonso, E. C. Cosgriff
Publikováno v:
Ultramicroscopy. 108:1567-1578
The implementation of spherical aberration-corrected pre- and post-specimen lenses in the same instrument has facilitated the creation of sub-Angstrom electron probes and has made aberration-corrected scanning confocal electron microscopy (SCEM) poss
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::350925f34ca0fa6b030cd03e02df847d
https://doi.org/10.1016/j.ultramic.2008.05.007
https://doi.org/10.1016/j.ultramic.2008.05.007