Measurement and Simulation of the Magnetic Fields from a 555 Timer Integrated Circuit using a Quantum Diamond Microscope and Finite Element Analysis

Autor: P. Kehayias, E. V. Levine, L. Basso, J. Henshaw, M. Saleh Ziabari, M. Titze, R. Haltli, J. Okoro, D. R. Tibbetts, D. M. Udoni, E. Bielejec, M. P. Lilly, T.-M. Lu, P. D. D. Schwindt, A. M. Mounce

Quantum Diamond Microscope (QDM) magnetic field imaging is an emerging interrogation and diagnostic technique for integrated circuits (ICs). To date, the ICs measured with a QDM were either too complex for us to predict the expected magnetic fields a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c6abfb03aec76788906c20a5119db00f
http://arxiv.org/abs/2109.11473

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3D-Mapping and Manipulation of Photocurrent in an Optoelectronic Diamond Device.

Autor: Wood AA; School of Physics, University of Melbourne, Parkville, Victoria, 3010, Australia., McCloskey DJ; School of Physics, University of Melbourne, Parkville, Victoria, 3010, Australia., Dontschuk N; School of Physics, University of Melbourne, Parkville, Victoria, 3010, Australia., Lozovoi A; CUNY-The City College of New York, New York, 10031, USA., Goldblatt RM; School of Physics, University of Melbourne, Parkville, Victoria, 3010, Australia., Delord T; CUNY-The City College of New York, New York, 10031, USA., Broadway DA; School of Science, RMIT University, Melbourne, Victoria, 3000, Australia., Tetienne JP; School of Science, RMIT University, Melbourne, Victoria, 3000, Australia., Johnson BC; School of Science, RMIT University, Melbourne, Victoria, 3000, Australia., Mitchell KT; School of Physics, University of Melbourne, Parkville, Victoria, 3010, Australia., Lew CT; School of Physics, University of Melbourne, Parkville, Victoria, 3010, Australia., Meriles CA; CUNY-The City College of New York, New York, 10031, USA.; CUNY - The Graduate Center, New York, NY, 10016, USA., Martin AM; School of Physics, University of Melbourne, Parkville, Victoria, 3010, Australia.

Publikováno v: Advanced materials (Deerfield Beach, Fla.) [Adv Mater] 2024 Oct; Vol. 36 (40), pp. e2405338. Date of Electronic Publication: 2024 Aug 23.

MEASURING TRANSISTOR DAMAGE FACTORS IN A NON-STABLE DEFECT ENVIRONMENT

Autor: P. J. Griffin, R. M. Fleming, E. Bielejec, G. Vizkelethy, D. B. King

Publikováno v: Reactor Dosimetry State of the Art 2008.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::f7ba801e6345137ebd93d0410657bf7d
https://doi.org/10.1142/9789814271110_0017

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