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pro vyhledávání: '"E. Belohoukek"'
Autor:
E. Belohoukek, B. Wilkens, Thirumalai Venkatesan, A. Inam, L. Nazar, B. Brycki, Aly E. Fathy, X. D. Wu, D. Kalokitis, V. Pendrick, R. Brown
Publikováno v:
Journal of Electronic Materials. 19:117-121
A simple and versatile measurement technique has been demonstrated for characterization of thin film superconductors and the substrates on which they are deposited. Unlike other state of the art measurements that characterize only the top layer of un
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3bd63320f66f292147ac8bb827c5fc98
https://doi.org/10.1007/bf02655559
https://doi.org/10.1007/bf02655559
