Zobrazeno 1 - 6
of 6
pro vyhledávání: '"E. A. Kelm"'
Publikováno v:
SPIE Proceedings.
In this work a non-destructive method for measuring the thickness of the dielectric layers consisting of silicon dioxide and silicon nitride has been developed using a scanning electron microscope (SEM) equipped with energy dispersive X-ray spectrome
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4209d6ac94f0496cef2ce6024e328b2d
https://doi.org/10.1117/12.2265570
https://doi.org/10.1117/12.2265570
Publikováno v:
Semiconductors. 45:1399-1403
Single-crystal samples of cationic clathrates in the Sn-In-As-I system with different indium contents have been synthesized. Their crystal structure has been analyzed and their thermoelectric properties have been measured. These compounds are found t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ee6a412c290b2dfa2802c40d46fa5e2c
https://doi.org/10.1134/s106378261111025x
https://doi.org/10.1134/s106378261111025x
Publikováno v:
Russian Chemical Bulletin. 58:746-750
The solid solution Sn24AsxP19.3-xI8 in the range of compositions x from 0 to 16 was synthesized. The crystal structure was refined for seven compositions of the solid solution at —100 °C. All samples crystallize in the cubic space group Pm3 n with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a43f10984b5e7476cb0c1d87ab7f6401
https://doi.org/10.1007/s11172-009-0089-0
https://doi.org/10.1007/s11172-009-0089-0
Publikováno v:
SPIE Proceedings.
During failure analysis of modern integrated circuits it might be necessary to carry out investigations, including both analysis of the die topology and the input of electrical signals on its contact pads. However, during access to the die the contac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7fcc8eb4821143e66eb772dd5f7525f7
https://doi.org/10.1117/12.2181191
https://doi.org/10.1117/12.2181191
Autor:
B. S. Alstodt, A. A. Benedetti-Pichler, N. L�vgren, C. H. Liberalli, G. Denig�s, I. M. Kolthoff, F. S. Griffith, A. Martini, N. A. Tananajew, A. Ginzburg, E. Heyman, Lucy F. Kerley, G. Nilsson, E. F. Kelm, J. A. Wilkinson
Publikováno v:
Zeitschrift f�r Analytische Chemie. 121:211-218
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c97c0333b5574251affc5ae0b4b5af77
https://doi.org/10.1007/bf01399125
https://doi.org/10.1007/bf01399125
Autor:
E. C. Kelm
Publikováno v:
Review of Scientific Instruments. 39:775-776
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d010f0b43edb9433b37dc9d4db3529c9
https://doi.org/10.1063/1.1683503
https://doi.org/10.1063/1.1683503