Robust and Efficient Uncertainty Quantification and Validation of RFIC Isolation

Autor: Alessandro Di Bucchianico, E J W Maten, Ter, Pulch, R., Janssen, H. H. J. M., Niehof, J., Hanssen, M., Kapora, S.

Publikováno v: Radioengineering. 2014, vol. 23, č. 1, s. 308-318. ISSN 1210-2512
Radioengineering, Vol 23, Iss 1, Pp 308-318 (2014)
Pure TUe
RadioEngineering, 23(1), 308-318. Czech Technical University in Prague

Modern communication and identification products impose demanding constraints on reliability of components. Due to this, statistical constraints more and more enter optimization formulations of electronic products. Yield constraints often require eff

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::8ccfd686476b70c1be71df4f437ffe58
https://hdl.handle.net/11012/36422

Access time optimization of SRAM memory with statistical yield constraint

Autor: Doorn, T. S., E J W Maten, Ter, Alessandro Di Bucchianico, Beelen, T. G. J., Janssen, H. H. J. M.

Publikováno v: Proceedings of 22nd International Conference Radioelektronika 2012 (Brno, Czech Republic, April 17-18, 2012), 219-222
STARTPAGE=219;ENDPAGE=222;TITLE=Proceedings of 22nd International Conference Radioelektronika 2012 (Brno, Czech Republic, April 17-18, 2012)
Pure TUe

A product may fail when design parameters are subject to large deviations. To guarantee yield one likes to determine bounds on the parameter range such that the fail probability P fail is small. For Static Random Access Memory (SRAM) characteristics

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4e3c6e305837b24d983efb2c86450b9b
https://research.tue.nl/nl/publications/6cb41470-a438-4984-86b4-0f4c0501cd78

Importance sampling for high speed statistical Monte-Carlo simulations

Autor: E J W Maten, Ter, Doorn, T. S., Croon, J. A., Bargagli, A., Alessandro Di Bucchianico, Wittich, O.

Publikováno v: Pure TUe

As transistor dimensions of Static Random AccessMemory (SRAM) become smaller with each new technology generation, they become increasingly susceptible to statistical variations in their parameters. These statistical variations can result in failing m

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::eec9f1de8eb3904c450d6cddcba53a70
https://research.tue.nl/nl/publications/73ef7bcc-a225-441b-95c7-a4914f58ede1