Zobrazeno 1 - 10
of 266
pro vyhledávání: '"Duvvury, C."'
Autor:
Gossner, H., Duvvury, C.
Publikováno v:
In Microelectronics Reliability December 2015 55(12) Part B:2607-2613
Publikováno v:
In Microelectronics Reliability 2001 41(3):335-348
Publikováno v:
Journal of Applied Physics; Oct1974, Vol. 45 Issue 10, p4658-4660, 3p
Publikováno v:
2011 IEEE 23rd International Symposium on Power Semiconductor Devices & ICs (ISPSD); 2011, p164-167, 4p
Publikováno v:
2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-7, 7p
Autor:
Jahanzeb, A., Kankan Wang, Harrop, J., Brodsky, J., Ban, T., Ward, S., Schichl, J., Burgess, K., Duvvury, C.
Publikováno v:
2011 33rd NO POD PERMISSION Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD); 2011, p1-5, 5p
Publikováno v:
2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD); 2010, p307-310, 4p
Publikováno v:
2010 IEEE International Reliability Physics Symposium (IRPS); 2010, p853-856, 4p
Publikováno v:
2010 32nd Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD); 2010, p1-8, 8p