Zobrazeno 1 - 10
of 547
pro vyhledávání: '"Duvvury, C."'
Autor:
Gossner, H., Duvvury, C.
Publikováno v:
In Microelectronics Reliability December 2015 55(12) Part B:2607-2613
Autor:
Boselli, G., Duvvury, C.
Publikováno v:
In Microelectronics Reliability 2005 45(9):1406-1414
Publikováno v:
In Microelectronics Reliability 2001 41(3):335-348
Publikováno v:
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual; 2003, p229-234, 6p
Publikováno v:
2002 IEEE International Reliability Physics Symposium. Proceedings 40th Annual (Cat. No.02CH37320); 2002, p148-155, 8p
Publikováno v:
Digest. International Electron Devices Meeting; 2002, p349-352, 4p
Publikováno v:
2001 Electrical Overstress/Electrostatic Discharge Symposium; 2001, p190-202, 13p
Publikováno v:
Journal of Applied Physics; Oct1974, Vol. 45 Issue 10, p4658-4660, 3p
Publikováno v:
Proceedings of IEEE International Electron Devices Meeting; 1993, p899-902, 4p
Publikováno v:
Proceedings of 1994 IEEE International Electron Devices Meeting; 1994, p407-410, 4p