Zobrazeno 1 - 10
of 101
pro vyhledávání: '"Dutertre, J.M."'
Autor:
Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G., Sarafianos, A.
Publikováno v:
In Microelectronics Reliability September-October 2014 54(9-10):2289-2294
Publikováno v:
In Microelectronics Reliability September-November 2013 53(9-11):1320-1324
Autor:
Sarafianos, A., Llido, R., Dutertre, J.M., Gagliano, O., Serradeil, V., Lisart, M., Goubier, V., Tria, A., Pouget, V., Lewis, D.
Publikováno v:
In Microelectronics Reliability September-October 2012 52(9-10):2035-2038
Autor:
Seçkiner, Soner1 (AUTHOR) selcuk.kose@rochester.edu, Köse, Selçuk1 (AUTHOR)
Publikováno v:
Information (2078-2489). Aug2024, Vol. 15 Issue 8, p488. 12p.
Autor:
Lee, Sang-su1 (AUTHOR) jsmoon@etri.re.kr, Moon, Jong-sik1 (AUTHOR), Choi, Yong-je1 (AUTHOR), Kim, Daewon1 (AUTHOR), Lee, Seungkwang2 (AUTHOR) sk.cryptographic@dankook.ac.kr
Publikováno v:
Sensors (14248220). Jul2024, Vol. 24 Issue 13, p4163. 18p.
Publikováno v:
RADECS 2001. 2001 6th European Conference on Radiation & Its Effects on Components & Systems (Cat. No.01TH8605); 2001, p243-247, 5p
Autor:
Upadhyaya, Devanshi1 (AUTHOR) devanshi.upadhyaya@iti.uni-stuttgart.de, Gay, Maël1 (AUTHOR), Polian, Ilia1 (AUTHOR)
Publikováno v:
Cryptography (2410-387X). Mar2024, Vol. 8 Issue 1, p2. 25p.
Autor:
Ruminot, Nicolás1 (AUTHOR) nicolas.ruminot@ug.uchile.cl, Estevez, Claudio1 (AUTHOR) cestevez@uchile.cl, Montejo-Sánchez, Samuel2 (AUTHOR) smontejo@utem.cl
Publikováno v:
Sensors (14248220). Aug2023, Vol. 23 Issue 16, p7180. 17p.
Autor:
Kajol, Mashrafi Alam1 (AUTHOR) mashrafialam.kajol@unh.edu, Monjur, Mohammad Mezanur Rahman1 (AUTHOR), Yu, Qiaoyan1 (AUTHOR) qiaoyan.yu@unh.edu
Publikováno v:
Sensors (14248220). Jun2023, Vol. 23 Issue 12, p5685. 18p.
Autor:
Jiang, Huilong1,2 (AUTHOR), Zhu, Xiang1,2 (AUTHOR) zhuxiang@nssc.ac.cn, Han, Jianwei1,2 (AUTHOR) zhuxiang@nssc.ac.cn
Publikováno v:
Symmetry (20738994). Oct2022, Vol. 14 Issue 10, pN.PAG-N.PAG. 18p.