Zobrazeno 1 - 10
of 37
pro vyhledávání: '"Dureseti Chidambarrao"'
Autor:
Hai Zhu, Katsunori Onishi, Stephen Wu, Adam Yang, Byoung-Wook Jeong, Seong-Joon Lim, Nan Jing, Choong-Ho Lee, David Conrady, Dureseti Chidambarrao
Publikováno v:
2023 35th International Conference on Microelectronic Test Structure (ICMTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f0df4f1df6c3621ce13f4347e8784eb3
https://doi.org/10.1109/icmts55420.2023.10094149
https://doi.org/10.1109/icmts55420.2023.10094149
Autor:
Paul J. Logsdon, Preetham M. Lobo, John Isakson, Alan Wagstaff, Ofer Geva, Eric J. Lukes, Parashurama Pradeep Bhadravati, Anthony Saporito, Christopher J. Berry, Dina Hamid, Brian Deskin, Brandon Bruen, Mark Cichanowski, Brian Bell, Gregory J. Fredeman, Dinesh Kannambadi, Jesse Surprise, Alper Buyuktosunoglu, S. Carey, Chris Cavitt, Ramon Bertran, David H. Wolpert, Michael Romain, Dureseti Chidambarrao, Tobias Webel, Adam R. Jatkowski, Ashutosh Mishra, Ishita Agarwal, Hunter Shi
Publikováno v:
IEEE Journal of Solid-State Circuits. 56:98-111
The IBM z15 system improves upon the prior-generation z14 design within the same chip footprint and technology node, while featuring the addition of two cores, 33%/100%/43% additional L2/L3/L4 cache, as well as additional core features and on-chip ac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::859d6c3e812ea5ed743d93a2d941f4ce
https://doi.org/10.1109/jssc.2020.3030062
https://doi.org/10.1109/jssc.2020.3030062
Autor:
S. Carey, Christos Vezrytzis, Anthony Saporito, Pierce Chuang, Alper Buyuktosunoglu, Phillip J. Restle, Tobias Webel, Christian Jacobi, Preetham M. Lobo, Hunter Shi, Christopher J. Berry, David H. Wolpert, Dureseti Chidambarrao, Ramon Bertran, Thomas Strach, Pawel Owczarczyk, Yaniv Maroz, Richard F. Rizzolo
Publikováno v:
IEEE Journal of Solid-State Circuits. 54:121-132
The IBM z14 is the latest update in the storied history of IBM mainframes. Reliability, availability, security, and scalability are the foundation of the IBM mainframe line. System reliability and availability targets are in excess of 10 years, requi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a7d77c01b32959ce9e487e72465feba8
https://doi.org/10.1109/jssc.2018.2873582
https://doi.org/10.1109/jssc.2018.2873582
Autor:
Anthony Saporito, Jesse Surprise, Mark Cichanowski, Brian Deskin, Parashurama Pradeep Bhadravati, Gregory J. Fredeman, John Isakson, Preetham M. Lobo, Ramon Bertran, Brian Bell, Brandon Bruen, Alper Buyuktosunoglu, Chris Cavitt, Ashutosh Mishra, Ofer Geva, Tobias Webel, Adam R. Jatkowski, Dina Hamid, David H. Wolpert, Dureseti Chidambarrao, Christopher J. Berry
Publikováno v:
ISSCC
The latest IBM Z microprocessor in the z15 system has been redesigned to have improved performance, system capacity and security over the previous z14 system [1]. These achievements are made while maintaining the central processor (CP) and system con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5098d5d3586a1bb77402a43349912352
https://doi.org/10.1109/isscc19947.2020.9063030
https://doi.org/10.1109/isscc19947.2020.9063030
Autor:
Ofer Geva, Brian Deskin, Gregory J. Fredeman, Mark Cichanowski, Adam R. Jatkowski, Brian Bell, John Isakson, Christopher J. Berry, Chris Cavitt, Giora Biran, Brandon Bruen, David H. Wolpert, Jesse Surprise, Dureseti Chidambarrao, Dina Hamid, Michael H. Wood, S. Carey, L. Sigal, Gerald Strevig, Drew Turner
Publikováno v:
IBM Journal of Research and Development. 64:8:1-8:12
The IBM Z processor continues to improve over previous System Z processors, but for the first time it does so without a technology improvement as the baseline enabler. The IBM z15 was designed in the same 14-nm High-Performance GLOBALFOUNDRIES techno
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::055f34e9caed632df1b94bf3f2f6723e
https://doi.org/10.1147/jrd.2020.3008099
https://doi.org/10.1147/jrd.2020.3008099
Autor:
Jose L. Neves, Ofer Geva, Anthony Saporito, Mark Cichanowski, Christopher J. Berry, Christian Jacobi, John Badar, Brian Bell, Christian Zoellin, L. Sigal, B. Huott, James D. Warnock, Richard F. Rizzolo, Jesse Surprise, S. Carey, Frank Malgioglio, Arthur J. O'Neill, Guenter Mayer, Robert J. Sonnelitter, John Isakson, Dina Hamid, Michael G. Wood, Ricardo H. Nigaglioni, David Wolpert, Dureseti Chidambarrao
Publikováno v:
ISSCC
The IBM Z microprocessor in the z14 system has been redesigned to improve performance, system capacity, and security [1] over the previous z13 system [2]. The system contains up to 24 central processor (CP) and 4 system controller (SC) chips. Each CP
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b3fc78d2a0a09b0b28c2104fc9ef5268
https://doi.org/10.1109/isscc.2018.8310171
https://doi.org/10.1109/isscc.2018.8310171
Autor:
Dongbing Shao, Ravikumar Ramachandran, Dureseti Chidambarrao, Eastman Eric, Matthew Angyal, Rasit O. Topaloglu, Werner A. Rausch
Publikováno v:
SPIE Proceedings.
We demonstrate a tool which can function as an interface between VLSI designers and process-technology engineers throughout the Design-Technology Co-optimization (DTCO) process. This tool uses a Monte Carlo algorithm on the output of lithography simu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::748f619c85eae04311883c0cc7483ec2
https://doi.org/10.1117/12.2258002
https://doi.org/10.1117/12.2258002
Autor:
E. Engbrecht, Edward P. Maciejewski, Christopher D. Sheraw, R. Divakaruni, Zhengwen Li, Allen H. Gabor, L. Economikos, Fernando Guarin, N. Zhan, H-K Lee, MaryJane Brodsky, Kenneth J. Stein, Siyuranga O. Koswatta, Y. Yang, Byeong Y. Kim, J. Hong, A. Bryant, Herbert L. Ho, Ruqiang Bao, Nicolas Breil, Babar A. Khan, E. Woodard, W-H. Lee, C-H. Lin, A. Levesque, Kevin McStay, V. Basker, Viraj Y. Sardesai, C. Tran, A. Ogino, Reinaldo A. Vega, C. DeWan, Shreesh Narasimha, J-J. An, Amit Kumar, A. Aiyar, Ravikumar Ramachandran, W. Wang, X. Wang, W. Nicoll, D. Hoyos, A. Friedman, Barry Linder, Yongan Xu, E. Alptekin, Cathryn Christiansen, S. Polvino, Han Wang, Scott R. Stiffler, G. Northrop, S. Saudari, J. Rice, Saraf Iqbal Rashid, Sunfei Fang, Michael V. Aquilino, Z. Ren, B. Kannan, Geng Wang, Noah Zamdmer, T. Kwon, Paul D. Agnello, Hasan M. Nayfeh, S. Jain, Robert R. Robison, M. Hasanuzzaman, J. Cai, L. Lanzerotti, D. Wehelle-Gamage, Basanth Jagannathan, J. Johnson, E. Kaste, Kai Zhao, Huiling Shang, Carl J. Radens, Shariq Siddiqui, Y. Ke, D. Ferrer, Ximeng Guan, D. Conklin, K. Boyd, K. Henson, Siddarth A. Krishnan, Bernard A. Engel, H. Dong, S. Mahajan, Unoh Kwon, Dominic J. Schepis, William Y. Chang, Liyang Song, Brian J. Greene, Chengwen Pei, S.-J. Jeng, Clevenger Leigh Anne H, Vijay Narayanan, C. Zhu, Wai-kin Li, Henry K. Utomo, Wei Liu, Dureseti Chidambarrao
Publikováno v:
2014 IEEE International Electron Devices Meeting.
We present a fully integrated 14nm CMOS technology featuring finFET architecture on an SOI substrate for a diverse set of SoC applications including HP server microprocessors and LP ASICs. This SOI finFET architecture is integrated with a 4th generat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6233530b0b3fd6ddc14276a018716523
https://doi.org/10.1109/iedm.2014.7046977
https://doi.org/10.1109/iedm.2014.7046977
Autor:
Mukesh Khare, James N. Pan, D.V. Singh, Kathryn W. Guarini, Hasan M. Nayfeh, John M. Hergenrother, B.L. Tessier, John A. Ott, Meikei Ieong, Linda Black, O. Dokumaci, Wilfried Haensch, R. Venigalla, Zhibin Ren, Jeffrey W. Sleight, Wesley C. Natzle, Dureseti Chidambarrao
Publikováno v:
IEEE Electron Device Letters. 27:288-290
In this letter, the effect of longitudinal uniaxial mechanical stress on electron mobility in high-performance fully depleted ultrathin silicon-on-insulator nFETs with a raised source/drain (RSD) architecture and channel lengths ranging from 1 /spl m
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::074a030861c0b1f62a6f0afd9cb27b02
https://doi.org/10.1109/led.2006.871542
https://doi.org/10.1109/led.2006.871542
Autor:
Deborah A. Ryan, Dureseti Chidambarrao, Mark S. Styduhar, Lee Wang, Anand Kumaraswamy, Ioana Graur, Tina Wagner, Jeanne P. Bickford
Publikováno v:
SPIE Proceedings.
For process development of deep-subwavelength technologies, it has become accepted practice to use model-based simulation to predict systematic and parametric failures. Increasingly, these techniques are being used by designers to ensure layout manuf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::63eecdccb44d1149c6bae53bbefc3830
https://doi.org/10.1117/12.879537
https://doi.org/10.1117/12.879537