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Autor:
Dunja Milinovic, Ghafar Ali, Tahirzeb Khan, Iftikhar Ahmad, Amani Alruwaili, Muhammad Maqbool
Publikováno v:
Semiconductors. 52:2039-2045
Thin films of AlN:Tm are deposited on a Si(111) and Si(100) substrates and optical fiber by rf magnetron sputtering method. 200–400 nm thick films are deposited at various temperatures to observe the effect of temperature on their structure and mor