Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Duhyun Jeon"'
Publikováno v:
IEEE Journal of Solid-State Circuits. 58:1185-1196
Publikováno v:
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST).
Publikováno v:
IEEE Journal of Solid-State Circuits. 55:805-816
This article proposes a physical unclonable function (PUF) based on the contact formation probability. The contact here is the interconnect layer between the metal and the silicon in a chip. As the contact is designed smaller than the size given in t
Circuit design of physical unclonable function for security applications in standard CMOS technology
Autor:
Byong-Deok Choi, Duhyun Jeon
Publikováno v:
2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC).
Publikováno v:
DSD
This paper compares two types of physical unclonable function (PUF) circuits in terms of reliability, mismatch-based PUF vs. physical-based PUF. Most previous PUF circuits utilize device mismatches for generating random responses. Although they have