Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Duhyun Jeon"'
Publikováno v:
IEEE Journal of Solid-State Circuits. 58:1185-1196
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f181a90b8c6aea7f9bbb615e262acf2
https://doi.org/10.1109/jssc.2022.3189351
https://doi.org/10.1109/jssc.2022.3189351
Publikováno v:
2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c34d3c879734aa40602362f9ad83f36e
https://doi.org/10.1109/host54066.2022.9839746
https://doi.org/10.1109/host54066.2022.9839746
Publikováno v:
IEEE Journal of Solid-State Circuits. 55:805-816
This article proposes a physical unclonable function (PUF) based on the contact formation probability. The contact here is the interconnect layer between the metal and the silicon in a chip. As the contact is designed smaller than the size given in t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e6ee3e134d52b1b9c03d872ea6c50c8d
https://doi.org/10.1109/jssc.2019.2951415
https://doi.org/10.1109/jssc.2019.2951415
Circuit design of physical unclonable function for security applications in standard CMOS technology
Autor:
Byong-Deok Choi, Duhyun Jeon
Publikováno v:
2016 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b5b837f54ea9a2448086482430b9653
https://doi.org/10.1109/edssc.2016.7785216
https://doi.org/10.1109/edssc.2016.7785216
Publikováno v:
DSD
This paper compares two types of physical unclonable function (PUF) circuits in terms of reliability, mismatch-based PUF vs. physical-based PUF. Most previous PUF circuits utilize device mismatches for generating random responses. Although they have
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4c2c0f961979c86f8f09e7e3c0e3316c
https://doi.org/10.1109/dsd.2015.57
https://doi.org/10.1109/dsd.2015.57
Autor:
AL-MEER, ABDULAZIZ, AL-KUWARI, SAIF
Publikováno v:
ACM Computing Surveys; 2023 Suppl14s, Vol. 55, p1-31, 31p
Autor:
Jeon, Duhyun, Baek, Jong Hak, Kim, Yong-Duck, Lee, Jaeseong, Kim, Dong Kyue, Choi, Byong-Deok
Publikováno v:
IEEE Journal of Solid-State Circuits; Mar2020, Vol. 55 Issue 3, p805-816, 12p
Publikováno v:
2014 International Conference on Computer Graphics Theory & Applications (GRAPP); 2014, pv-xvi, 12p