Zobrazeno 1 - 10
of 375
pro vyhledávání: '"Ducourtieux S"'
Autor:
Lafont, F., Ribeiro-Palau, R., Han, Z., Cresti, A., Delvallée, A., Cummings, A. W., Roche, S., Bouchiat, V., Ducourtieux, S., Schopfer, F., Poirier, W.
Publikováno v:
Phys. Rev. B, 90, 115422 (2014)
We report on the observation of strong backscattering of charge carriers in the quantum Hall regime of polycrystalline graphene grown by chemical vapor deposition, which alters the accuracy of the Hall resistance quantization. The temperature and mag
Externí odkaz:
http://arxiv.org/abs/1404.2536
Autor:
Chivas-Joly, C., Gaie-Levrel, F., Motzkus, C., Ducourtieux, S., Delvallée, A., De Lagos, F., Nevé, S. Le, Gutierrez, J., Lopez-Cuesta, J.-M.
Publikováno v:
In Journal of Hazardous Materials 15 January 2016 301:153-162
Autor:
Bu T; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, National Institute of Metrology (NIM), Beijing, 100029, People's Republic of China., Gao H; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, National Institute of Metrology (NIM), Beijing, 100029, People's Republic of China., Yao Y; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, National Institute of Metrology (NIM), Beijing, 100029, People's Republic of China., Wang J; Department of Physics, China Jiliang University, Hangzhou, Zhejiang, 310018, People's Republic of China., Pollard AJ; National Physical Laboratory (NPL), Hampton Road, Teddington, TW11 0LW, United Kingdom., Legge EJ; National Physical Laboratory (NPL), Hampton Road, Teddington, TW11 0LW, United Kingdom., Clifford CA; National Physical Laboratory (NPL), Hampton Road, Teddington, TW11 0LW, United Kingdom., Delvallée A; Department of Materials Science, National Laboratory of Metrology and Testing (LNE), 29 Avenue Roger Hennequin, F-78197 Trappes, France., Ducourtieux S; Department of Materials Science, National Laboratory of Metrology and Testing (LNE), 29 Avenue Roger Hennequin, F-78197 Trappes, France., Lawn MA; National Measurement Institute Australia (NMIA), 36 Bradfield Road, Lindfield, New South Wales 2070, Australia., Babic B; National Measurement Institute Australia (NMIA), 36 Bradfield Road, Lindfield, New South Wales 2070, Australia., Coleman VA; National Measurement Institute Australia (NMIA), 36 Bradfield Road, Lindfield, New South Wales 2070, Australia., Jämting Å; National Measurement Institute Australia (NMIA), 36 Bradfield Road, Lindfield, New South Wales 2070, Australia., Zou S; Metrology Research Centre, National Research Council of Canada (NRC-CNRC), Ottawa, Ontario, K1A 0R6, Canada., Chen M; Metrology Research Centre, National Research Council of Canada (NRC-CNRC), Ottawa, Ontario, K1A 0R6, Canada., Jakubek ZJ; Metrology Research Centre, National Research Council of Canada (NRC-CNRC), Ottawa, Ontario, K1A 0R6, Canada., Iacob E; Bruno Kessler Foundation, Sensors and Devices Center, Micro Nano Facility Unit (MNF), Trento I-38123, Italy., Chanthawong N; National Institute of Metrology (Thailand) (NIMT), 3/4-5 Moo 3, Klong 5, Klong Luang, Pathumthani, Thailand., Mongkolsuttirat K; National Institute of Metrology (Thailand) (NIMT), 3/4-5 Moo 3, Klong 5, Klong Luang, Pathumthani, Thailand., Zeng G; Danmarks Nationale Metrologiinstitut (DFM), Kogle Allé 5 D-2970 Hørsholm Danmark., Almeida CM; National Institute of Metrology, Quality and Technology (INMETRO), Duque de Caxias RJ, Brazil., He BC; Center for Measurement Standards, Industrial Technology Research Institute (CMS/ITRI), Hsinchu 30011, Chinese TaiPei, People's Republic of China., Hyde L; Swinburne University of Technology, John Street, Hawthorn, VIC 3122 Australia., Ren L; Technology Innovation Center of Graphene Metrology and Standardization for State Market Regulation, National Institute of Metrology (NIM), Beijing, 100029, People's Republic of China.
Publikováno v:
Nanotechnology [Nanotechnology] 2023 Mar 16; Vol. 34 (22). Date of Electronic Publication: 2023 Mar 16.
Akademický článek
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Autor:
Delvallée, A., Oulalite, M., Crouzier, L., Ducourtieux, S., Lambeng, N., Amor, W., Bouzakher Ghomrasni, N., Feltin, N., Viot, A., Jamet, C.
Publikováno v:
Microscopy Today; May2021, Vol. 29 Issue 3, p46-51, 6p
Publikováno v:
In Applied Surface Science 2000 164(1):118-123
Autor:
El Naggar, Kamilia A. M.1 (AUTHOR) kamilia@eaeat-academy.edu.eg, Abd El-Razik, Mahmoud M.2 (AUTHOR), Kuku, Mohammed3 (AUTHOR) mkuku@jazanu.edu.sa, Arishi, Mohammad4 (AUTHOR), Maafa, Ibrahim M.4 (AUTHOR), Yousef, Ayman4 (AUTHOR) aymanhassan@jazanu.edu.sa, Abdel Hamid, Eman M.1 (AUTHOR)
Publikováno v:
Minerals (2075-163X). Oct2024, Vol. 14 Issue 10, p977. 24p.
Autor:
Crouzier L; Laboratoire National de métrologie et d'Essais - Nanometrology, 29 avenue Hennequin, 78197 Trappes Cedex, France; Institut Pprime Département Physique et Mécanique des Matériaux - 11 Bd Marie et Pierre Curie, 86962 Futuroscope Chasseneuil, France. Electronic address: Loic.Crouzier@lne.fr., Delvallée A; Laboratoire National de métrologie et d'Essais - Nanometrology, 29 avenue Hennequin, 78197 Trappes Cedex, France., Ducourtieux S; Laboratoire National de métrologie et d'Essais - Nanometrology, 29 avenue Hennequin, 78197 Trappes Cedex, France., Devoille L; Laboratoire National de métrologie et d'Essais - Nanometrology, 29 avenue Hennequin, 78197 Trappes Cedex, France., Tromas C; Institut Pprime Département Physique et Mécanique des Matériaux - 11 Bd Marie et Pierre Curie, 86962 Futuroscope Chasseneuil, France., Feltin N; Laboratoire National de métrologie et d'Essais - Nanometrology, 29 avenue Hennequin, 78197 Trappes Cedex, France.
Publikováno v:
Ultramicroscopy [Ultramicroscopy] 2019 Dec; Vol. 207, pp. 112847. Date of Electronic Publication: 2019 Sep 25.
Autor:
Chivas-Joly, C., Motzkus, C., Guillaume, E., Ducourtieux, S., Saragoza, L., Lesenechal, D., Lopez-Cuesta, José-Marie, Longuet, C., Sonnier, Rodolphe, Minisini, Benoît
Publikováno v:
FIRE AND MATERIALS
FIRE AND MATERIALS, 2014, 38 (1), pp.46-62. ⟨10.1002/fam.2161⟩
FIRE AND MATERIALS, 2014, 38 (1), pp.46-62. ⟨10.1002/fam.2161⟩
International audience; Carbon nanotube-based poly(methyl methacrylate) and polyamide-6 nanocomposites have been investigated using various techniques within the framework of the NANOFEU project. Scanning transmission electron microscopy was used to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1f35ee674cf3fc94a027f1ac2d414ede
https://hal.archives-ouvertes.fr/hal-02914235/document
https://hal.archives-ouvertes.fr/hal-02914235/document
Akademický článek
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