Comprehensive synchronous reference frame discrete-time modelling of a grid-connected PV for fast DC-side voltage control

Autor: Almeida, Pedro M., Barbosa, Pedro G., Duarte, Jorge L., Ribeiro, Paulo F.

Publikováno v: In Electric Power Systems Research September 2017 150:162-168

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Square wave operation to reduce pulsating power in isolated MMC-based ultrafast chargers

Autor: Pereira Marca, Ygor, Roes, Maurice G.L., Duarte, Jorge L., Wijnands, C.G.E.

Publikováno v: 24th European Conference on Power Electronics and Applications, EPE 2022 ECCE Europe

This paper presents an application of modular multilevel converters to reduce pulsating power, and therefore sub-modules in ultrafast chargers. The converter’s analysis and a control scheme were presented to realize bidirectional power transfer bet

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::178bf1479e7b5091e1706304f6bb95f2
https://research.tue.nl/nl/publications/7b700b58-8c80-4566-9629-9d66abfc6a5b

Multilevel Gate Driver with Adjustable Gate Voltage for Thermal Stress Reduction of Power Switches in Electric Drive Application

Autor: Wang, Lie, Vermulst, Bas J.D., Duarte, Jorge L.

Publikováno v: PCIM Europe-International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2020, 1536-1543
STARTPAGE=1536;ENDPAGE=1543;TITLE=PCIM Europe-International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2020

Due to varying load currents, the junction temperature variations of power switches causes thermal stress and compromises lifetime. In this paper, proper gate voltage control is used for all power switches in a three-phase electric drive to smooth th

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::d77b69aa7aea0d70571e724dc04b2d0f
https://research.tue.nl/nl/publications/30441716-cd28-422d-b64d-ce66eb06be4d

Thermal Stress Reduction and Lifetime Improvement of Power Switches with Dynamic Gate Driving Strategy

Autor: Wang, Lie, Vermulst, Bas J.D., Duarte, Jorge L.

Publikováno v: IEEE Young Researchers Symposium in Electrical Power Engineering (YRS 2018)

The thermal stress and lifetime of semiconductor power switches are largely influenced by its current flow profile. Considerable thermal stress and reduced lifetime problems occur especially at low frequency operation. In this paper, a dynamic gate d

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=narcis______::58b0e7416fbfac33a6936c4b7f6cb99a
https://research.tue.nl/nl/publications/2e160571-a801-444e-890d-f6c3802be7f3