Zobrazeno 1 - 10
of 21
pro vyhledávání: '"Duan, Yuyan"'
The elicitation of power priors, based on the availability of historical data, is realized by raising the likelihood function of the historical data to a fractional power {\delta}, which quantifies the degree of discounting of the historical informat
Externí odkaz:
http://arxiv.org/abs/2204.05615
Autor:
Duan, Yuyan
This research is motivated by an issue frequently encountered in environmental water quality evaluation. Many times, the sample size of water monitoring data is too small to have adequate power. Here, we present a Bayesian power prior approach by inc
Externí odkaz:
http://hdl.handle.net/10919/29976
http://scholar.lib.vt.edu/theses/available/etd-12072005-133505/
http://scholar.lib.vt.edu/theses/available/etd-12072005-133505/
Publikováno v:
Nonferrous Metals (Mineral Processing Section); May2024, Issue 5, p89-98, 10p
Publikováno v:
Nonferrous Metals (Mineral Processing Section); May2024, Issue 5, p1-13, 13p
Publikováno v:
Journal of Agricultural, Biological, and Environmental Statistics, 2006 Jun 01. 11(2), 151-168.
Externí odkaz:
https://www.jstor.org/stable/27595593
Akademický článek
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Autor:
Chen, Zhuo, Duan, Yuyan, Shan, Songzhe, Sun, Kaida, Wang, Gang, Shao, Changyu, Tang, Zhenhang, Xu, Zekai, Zhou, Yanyan, Chen, Zhi, Tang, Ruikang, Pan, Haihua, Xie, Zhijian
Publikováno v:
Nanoscale; 1/21/2022, Vol. 14 Issue 3, p642-652, 11p
Publikováno v:
Optical Metrology and Inspection for Industrial Applications V.
Semiconductor wafer is elementary unit in semiconductor industry. In the fabrication of semiconductor wafer, surface defects such as dirties, scratches, burrs, chippings and holes may be generated which severely affect the quality of downstream produ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bdf7d43e8c8b0c3e14da3ac6c67e1208
https://doi.org/10.1117/12.2502602
https://doi.org/10.1117/12.2502602
Publikováno v:
Proceedings of SPIE; 9/4/2018, Vol. 10819, p1-7, 7p
Autor:
Han, Sen, Yoshizawa, Toru, Zhang, Song, Tian, Qingguo, Xiao, Shuqi, Duan, Yuyan, Gao, Xiaoting, Zhou, Wanxin
Publikováno v:
Proceedings of SPIE; November 2018, Vol. 10819 Issue: 1 p108190J-108190J-7, 973718p