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Autor:
A. Almansa, Stefan Kolb, M. Zielony, V. Djakov, B. Schmidt, Ivo W. Rangelow, B. E. Volland, D. Dontzov, J. Mielczarski, N. Nikolov, M. Zier, K. Ivanova, S. E. Huq, Tzv. Ivanov, H. O. Blom, T. Sulzbach, R. Pedreau, P. Zawierucha, Ivan Kostic, O. Fortagne, Piotr Grabiec, Du P. Latimier, Wolfgang Engl, Y. Sarov, Teodor Gotszalk, Klaus Edinger, Arun Persaud
Publikováno v:
Microelectronic Engineering 84(2007)5-8, 1260-1264
A major limitation for future nanotechnology, particularly for bottom-up manufacturing is the non-availability of 2-dimensional massively parallel probe arrays. Scanning proximity probes are uniquely powerful tools for analysis, manipulation and bott