Zobrazeno 1 - 10
of 18
pro vyhledávání: '"Dušan Vaňa"'
Autor:
Viera Zatkalíková, Juraj Halanda, Dušan Vaňa, Milan Uhríčik, Lenka Markovičová, Milan Štrbák, Lenka Kuchariková
Publikováno v:
Materials, Vol 14, Iss 22, p 6790 (2021)
Plasma immersion ion implantation (PIII) of nitrogen is low-temperature surface technology which enables the improvement of tribological properties without a deterioration of the corrosion behavior of austenitic stainless steels. In this paper the co
Externí odkaz:
https://doaj.org/article/d1dc8a8e66174f7cb404128c095e673d
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Au-Ag alloy nanoparticles were formed into amorphous silicon by sequential ion implantation of Au and Ag. Monocrystalline Si was amorphized at the initial moment of implantation with 1 × 1016 ions/cm2 gold ions, and then different silver fluences we
Autor:
Lenka Markovičová, Lenka Kuchariková, Milan Uhríčik, Dušan Vaňa, Viera Zatkalíková, Juraj Halanda, Milan Štrbák
Publikováno v:
Materials, Vol 14, Iss 6790, p 6790 (2021)
Materials; Volume 14; Issue 22; Pages: 6790
Materials
Materials; Volume 14; Issue 22; Pages: 6790
Materials
Plasma immersion ion implantation (PIII) of nitrogen is low-temperature surface technology which enables the improvement of tribological properties without a deterioration of the corrosion behavior of austenitic stainless steels. In this paper the co
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 450:168-172
Ion Beam Analysis is an important part of the new Ion Beam Laboratory at the Slovak University of Technology in Bratislava based on a HVEE 6 MV Tandetron® accelerator. The system is equipped with an end station for Rutherford Backscattering Spectrom
Publikováno v:
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Formation of Au-Ag alloy nanoparticles in TiN thin films is demonstrated through sequential implantation of Au and Ag ions. The irradiations were done with 200 keV Au ions at fluence of 1.0 × 1016 ions/cm2 and 150 keV Ag ions to the fluences in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::03fe7895ecc81e8efbbe32611b79b024
https://vinar.vin.bg.ac.rs/handle/123456789/9589
https://vinar.vin.bg.ac.rs/handle/123456789/9589
Publikováno v:
Research Papers. Faculty of Materials Science and Technology. Slovak University of Technology in Trnava, Vol 26, Iss 43, Pp 9-16 (2018)
The new Ion Beam Centre (IBC) equipped with 6 MV tandem ion accelerator and 500 kV ion implanter systems was built at the Slovak University of Technology, Faculty of Materials Science and Technology (STU MTF). The facility provides Ion Beam Modificat
Publikováno v:
Research Papers. Faculty of Materials Science and Technology. Slovak University of Technology in Trnava, Vol 26, Iss 43, Pp 25-32 (2018)
The trace element analysis system is presented using Proton Induced X-ray Emission (PIXE) analysis at a new Ion Beam Centre in Trnava. Standard PIXE system dedicated to the measurement of thick solid samples was extended by a new application for trac
Autor:
Stanislav Minárik, Radoslav Halgaš, Anna Závacká, Pavol Noga, Martin Muška, Dušan Vaňa, Jozef Dobrovodský, Matúš Beňo, Róbert Riedlmajer
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 409:264-267
An ion beam laboratory (IBL) for materials research has been commissioned recently at the Slovak University of Technology within the University Science Park CAMBO located in Trnava. The facility will support research in the field of materials science
Autor:
M. Balogh, Matúš Beňo, Dušan Vaňa, Vladislav Matoušek, S. Vielhauer, M. Sedlák, A. Špaček, Jozef Dobrovodský, Pavol Noga, G. Kantay, M. Venhart, P. Konopka, A. Herzáň, A. Repko
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 1004:165368
A new automated method has been developed with the aim to correct measured spectra for sudden gain and offset drifts due to temporal instrumentation instabilities. It is based on discrete cross-correlation that alleviates the need for Gaussian-shaped
Publikováno v:
APPLIED PHYSICS OF CONDENSED MATTER (APCOM 2019).
In material research, the need to determine the composition of thin layers in the range of thickness from nm to few microns often arises. If light elements have to be measured in a material containing heavy elements, the Time of Flight Elastic Recoil