Zobrazeno 1 - 10
of 796
pro vyhledávání: '"Dryahina K"'
Autor:
Dryahina K; J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague, Czechia., Polášek M; J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague, Czechia., Jašík J; J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague, Czechia., Sovová K; J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague, Czechia., Španěl P; J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague, Czechia.
Publikováno v:
Mass spectrometry reviews [Mass Spectrom Rev] 2024 Nov 06. Date of Electronic Publication: 2024 Nov 06.
Autor:
Španěl P; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia., Dryahina K; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia., Omezzine Gnioua M; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia.; Department of Surface and Plasma Science, Faculty of Mathematics and Physics, Charles University, Prague, Czech Republic., Smith D; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia.
Publikováno v:
Rapid communications in mass spectrometry : RCM [Rapid Commun Mass Spectrom] 2023 May 15; Vol. 37 (9), pp. e9496.
Autor:
Langford VS; Syft Technologies Limited, 68 Saint Asaph Street, Christchurch 8011, New Zealand., Dryahina K; J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague 182 23, Czechia., Španěl P; J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague 182 23, Czechia.
Publikováno v:
Journal of the American Society for Mass Spectrometry [J Am Soc Mass Spectrom] 2023 Dec 06; Vol. 34 (12), pp. 2630-2645. Date of Electronic Publication: 2023 Nov 21.
Autor:
Swift SJ; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Prague 8, Czech Republic., Smith D; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Prague 8, Czech Republic., Dryahina K; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Prague 8, Czech Republic., Gnioua MO; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Prague 8, Czech Republic., Španěl P; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Prague 8, Czech Republic.
Publikováno v:
Rapid communications in mass spectrometry : RCM [Rapid Commun Mass Spectrom] 2022 Aug 15; Vol. 36 (15), pp. e9328.
Autor:
Swift SJ; J. Heyrovský Institute of Physical Chemistry of the CAS, v. v. i., Dolejškova 2155/3, Prague 182 23, Czechia. patrik.spanel@jh-inst.cas.cz., Dryahina K; J. Heyrovský Institute of Physical Chemistry of the CAS, v. v. i., Dolejškova 2155/3, Prague 182 23, Czechia. patrik.spanel@jh-inst.cas.cz., Lehnert AS; Syft Technologies, Hilperstraße 31, Darmstadt 64295, Germany., Demarais N; Syft Technologies, 68 Saint Asaph Street, Christchurch Central City, Christchurch 8011, New Zealand., Langford VS; Syft Technologies, 68 Saint Asaph Street, Christchurch Central City, Christchurch 8011, New Zealand., Perkins MJ; Element Lab Solutions, Unit 4, Wellbrook Court, Girton Rd, Girton, Cambridge CB3 0NA, UK., Silva LP; Syft Technologies, 675N Euclid St #627, Anaheim, CA 92801, USA., Omezzine Gnioua M; J. Heyrovský Institute of Physical Chemistry of the CAS, v. v. i., Dolejškova 2155/3, Prague 182 23, Czechia. patrik.spanel@jh-inst.cas.cz.; Faculty of Mathematics and Physics, Charles University, Ke Karlovu 3, Prague 121 16, Czechia., Španěl P; J. Heyrovský Institute of Physical Chemistry of the CAS, v. v. i., Dolejškova 2155/3, Prague 182 23, Czechia. patrik.spanel@jh-inst.cas.cz.
Publikováno v:
Analytical methods : advancing methods and applications [Anal Methods] 2023 Nov 30; Vol. 15 (46), pp. 6435-6443. Date of Electronic Publication: 2023 Nov 30.
Autor:
Dryahina K; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia., Polášek M; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia., Smith D; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia., Španěl P; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Prague, Czechia.
Publikováno v:
Rapid communications in mass spectrometry : RCM [Rapid Commun Mass Spectrom] 2021 Nov 30; Vol. 35 (22), pp. e9187.
Autor:
Dryahina K; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejškova 3, Prague 8, 18223, Czech Republic., Som S; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejškova 3, Prague 8, 18223, Czech Republic., Smith D; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejškova 3, Prague 8, 18223, Czech Republic., Španěl P; J. Heyrovsky Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejškova 3, Prague 8, 18223, Czech Republic.
Publikováno v:
Rapid communications in mass spectrometry : RCM [Rapid Commun Mass Spectrom] 2021 Apr 15; Vol. 35 (7), pp. e9047.
Publikováno v:
In International Journal of Mass Spectrometry 2009 286(1):1-6
Autor:
Brůhová Michalčíková R; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Dolejškova, Czech Republic.; Department of Physical and Macromolecular Chemistry, Faculty of Science, Charles University, Albertov, Czech Republic., Dryahina K; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Dolejškova, Czech Republic., Smith D; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Dolejškova, Czech Republic., Španěl P; J. Heyrovský Institute of Physical Chemistry, Academy of Sciences of the Czech Republic, Dolejškova, Czech Republic.
Publikováno v:
Rapid communications in mass spectrometry : RCM [Rapid Commun Mass Spectrom] 2020 Mar 15; Vol. 34 (5), pp. e8602.
Autor:
Lacko M; J. Heyrovský Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejškova 2155/3, Prague 182 23, Czech Republic.; Faculty of Mathematics and Physics, Charles University, V Holešovičkách 747/2, Prague 180 00, Czech Republic., Dryahina K; J. Heyrovský Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejškova 2155/3, Prague 182 23, Czech Republic., Španěl P; J. Heyrovský Institute of Physical Chemistry of the Czech Academy of Sciences, Dolejškova 2155/3, Prague 182 23, Czech Republic., Kratzer J; Institute of Analytical Chemistry of the Czech Academy of Sciences, Veveří 97, Brno 602 00, Czech Republic., Matoušek T; Institute of Analytical Chemistry of the Czech Academy of Sciences, Veveří 97, Brno 602 00, Czech Republic., Dědina J; Institute of Analytical Chemistry of the Czech Academy of Sciences, Veveří 97, Brno 602 00, Czech Republic.
Publikováno v:
Analytical chemistry [Anal Chem] 2022 Sep 27; Vol. 94 (38), pp. 13163-13170. Date of Electronic Publication: 2022 Sep 14.