Zobrazeno 1 - 10
of 527
pro vyhledávání: '"Driel, W.D."'
Autor:
Mehr, M. Yazdan a, ⁎, Hajipour, P. b, Karampoor, M.R. c, van Zeijl, H. a, van Driel, W.D. a, d, Cooremans, T. e, De Buyl, F. e, Zhang, G.Q. a
Publikováno v:
In Microelectronics Reliability January 2025 164
Autor:
Thukral, V., Roucou, R., Chou, C., Zaal, J.J.M., van Soestbergen, M., Rongen, R.T.H., van Driel, W.D., Zhang, G.Q.
Publikováno v:
In Microelectronics Reliability August 2024 159
Publikováno v:
In Microelectronics Reliability June 2024 157
Autor:
Herrmann, A., van Soestbergen, M., Erich, S.J.F., van der Ven, L.G.J., Huinink, H.P., van Driel, W.D., Mavinkurve, A., De Buyl, F., Adan, O.C.G.
Publikováno v:
In Microelectronics Reliability September 2022 136
Autor:
Herrmann, A., Erich, S.J.F., van der Ven, L.G.J., Huinink, H.P., van Driel, W.D., van Soestbergen, M., Mavinkurve, A., De Buyl, F., Fischer, H.R., Mol, J.M.C., Adan, O.C.G.
Publikováno v:
In Microelectronics Reliability July 2022 134
Autor:
Munirathinam, B., van Dam, J.P.B., Herrmann, A., van Driel, W.D., De Buyl, F., Erich, S.J.F., van der Ven, L.G.J., Adan, O.C.G., Mol, J.M.C.
Publikováno v:
In Journal of Materials Science & Technology 20 February 2021 64:203-213
Autor:
Herrmann, A., Erich, S.J.F., Ven, L.G.J.v.d., Huinink, H.P., van Driel, W.D., van Soestbergen, M., Mavinkurve, A., De Buyl, F., Mol, J.M.C., Adan, O.C.G.
Publikováno v:
In Optical Materials: X May 2020 6
Publikováno v:
In Microelectronics Reliability February 2018 81:136-142
Publikováno v:
In Microelectronics Reliability November 2017 78:294-298
Publikováno v:
In Microelectronics Reliability November 2017 78:143-147