Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Douglas D. Stauffer"'
Autor:
Frank W. DelRio, Scott J. Grutzik, William M. Mook, Sara M. Dickens, Paul G. Kotula, Eric D. Hintsala, Douglas D. Stauffer, Brad L. Boyce
Publikováno v:
Materials Research Letters, Vol 10, Iss 11, Pp 728-735 (2022)
In this letter, we demonstrated stable nanoscale fracture in single-crystal silicon using an in-situ wedge-loaded double cantilever beam (DCB) specimen. The fracture toughness KIC was calculated directly from instrumented measurement of force and dis
Externí odkaz:
https://doaj.org/article/556084ad988d4b5a9c40549530ccd645
Autor:
Moujhuri Sau, Eric D. Hintsala, Youxing Chen, Douglas D. Stauffer, Stuart A. Maloy, Benjamin P. Eftink, Thomas J. Lienert, Nathan A. Mara
Publikováno v:
JOM. 74:1469-1476
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7039e02630b82fee328881cac1b6fb85
https://doi.org/10.1007/s11837-022-05189-0
https://doi.org/10.1007/s11837-022-05189-0
Autor:
Andrew B. Kustas, Morgan R. Jones, Frank W. DelRio, Ping Lu, Jonathan Pegues, Prashant Singh, A.V. Smirnov, Jordan Tiarks, Eric D. Hintsala, Douglas D. Stauffer, Jessica K. Román-Kustas, Michael Abere, Emma M.H. White, Duane D. Johnson, Iver E. Anderson, Nicolas Argibay
Publikováno v:
Applied Materials Today. 29:101669
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9579492c8759ecfbee97b011143937e0
https://doi.org/10.1016/j.apmt.2022.101669
https://doi.org/10.1016/j.apmt.2022.101669
Publikováno v:
Journal of Applied Physics. 132:185101
High throughput nanoindentation techniques can provide rapid materials screening and property mapping and can span millimeter length scales and up to 106 data points. To facilitate rapid sorting of these data into similar groups, a necessary task for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6488694b5adfd48834300e39c8f029e6
https://doi.org/10.1063/5.0098493
https://doi.org/10.1063/5.0098493
Publikováno v:
Materialia. 9:100598
Extrinsic approaches for the pursuit of ductility in metallic glasses have involved the introduction of a ductile crystalline phase to inhibit the propagation of a dominant shear front through the amorphous matrix material. Using nanoindentation, we
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aaeb90273a691859edffdf8dc4246592
https://doi.org/10.1016/j.mtla.2020.100598
https://doi.org/10.1016/j.mtla.2020.100598
Autor:
Huang W; Department of Chemical and Environmental Engineering, University of California, Riverside, CA, USA.; Department of Materials Science and Engineering, University of California, Irvine, CA, USA., Shishehbor M; Lyles School of Civil Engineering, Purdue University, West Lafayette, IN, USA., Guarín-Zapata N; Lyles School of Civil Engineering, Purdue University, West Lafayette, IN, USA., Kirchhofer ND; Oxford Instruments Asylum Research, Goleta, CA, USA., Li J; Oxford Instruments Asylum Research, Goleta, CA, USA., Cruz L; Materials Science and Engineering Program, University of California, Riverside, CA, USA., Wang T; Materials Science and Engineering Program, University of California, Riverside, CA, USA., Bhowmick S; Bruker, Minneapolis, MN, USA., Stauffer D; Bruker, Minneapolis, MN, USA., Manimunda P; Bruker, Minneapolis, MN, USA., Bozhilov KN; Central Facility for Advanced Microscopy and Microanalysis, University of California, Riverside, CA, USA., Caldwell R; Department of Integrative Biology, University of California, Berkeley, CA, USA., Zavattieri P; Lyles School of Civil Engineering, Purdue University, West Lafayette, IN, USA., Kisailus D; Department of Chemical and Environmental Engineering, University of California, Riverside, CA, USA. david.k@uci.edu.; Department of Materials Science and Engineering, University of California, Irvine, CA, USA. david.k@uci.edu.; Materials Science and Engineering Program, University of California, Riverside, CA, USA. david.k@uci.edu.
Publikováno v:
Nature materials [Nat Mater] 2020 Nov; Vol. 19 (11), pp. 1236-1243. Date of Electronic Publication: 2020 Aug 17.
Autor:
Frankberg EJ; Unit of Materials Science and Environmental Engineering, Tampere University, Tampere, Finland. erkka.frankberg@tuni.fi lucile.joly-pottuz@insa-lyon.fr.; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France.; Center for Nano Science and Technology @PoliMi, Istituto Italiano di Tecnologia, Milano, Italy., Kalikka J; Computational Physics Laboratory, Tampere University, Tampere, Finland., García Ferré F; Center for Nano Science and Technology @PoliMi, Istituto Italiano di Tecnologia, Milano, Italy., Joly-Pottuz L; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France. erkka.frankberg@tuni.fi lucile.joly-pottuz@insa-lyon.fr., Salminen T; Tampere Microscopy Center, Tampere University, Tampere, Finland., Hintikka J; Unit of Materials Science and Environmental Engineering, Tampere University, Tampere, Finland., Hokka M; Unit of Materials Science and Environmental Engineering, Tampere University, Tampere, Finland., Koneti S; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France., Douillard T; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France., Le Saint B; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France., Kreiml P; Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria., Cordill MJ; Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria., Epicier T; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France., Stauffer D; Bruker Nano Surfaces, Bruker Inc., Eden Prairie, MN, USA., Vanazzi M; Center for Nano Science and Technology @PoliMi, Istituto Italiano di Tecnologia, Milano, Italy., Roiban L; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France., Akola J; Computational Physics Laboratory, Tampere University, Tampere, Finland.; Department of Physics, Norwegian University of Science and Technology, Trondheim, Norway., Di Fonzo F; Center for Nano Science and Technology @PoliMi, Istituto Italiano di Tecnologia, Milano, Italy., Levänen E; Unit of Materials Science and Environmental Engineering, Tampere University, Tampere, Finland., Masenelli-Varlot K; Université de Lyon, INSA-Lyon, UCBL, MATEIS, CNRS UMR 5510, Villeurbanne, France.
Publikováno v:
Science (New York, N.Y.) [Science] 2019 Nov 15; Vol. 366 (6467), pp. 864-869.
Autor:
Zhang Y; Department of Mechanical Engineering, Texas A&M University, College Station, Texas 77840, USA., Oh Y; Hysitron, Inc., 9625 West 76th Street, Minneapolis, Minnesota 55344, USA., Stauffer D; Hysitron, Inc., 9625 West 76th Street, Minneapolis, Minnesota 55344, USA., Polycarpou AA; Department of Mechanical Engineering, Texas A&M University, College Station, Texas 77840, USA.
Publikováno v:
The Review of scientific instruments [Rev Sci Instrum] 2018 Apr; Vol. 89 (4), pp. 045109.
Autor:
Kaps S; Institute for Materials Science, Kiel University, Kaiserstraße 2, D-24143 Kiel, Germany., Bhowmick S; Bruker Nano Surfaces, Minneapolis, Minnesota 55344, United States., Gröttrup J; Institute for Materials Science, Kiel University, Kaiserstraße 2, D-24143 Kiel, Germany., Hrkac V; Institute for Materials Science, Kiel University, Kaiserstraße 2, D-24143 Kiel, Germany., Stauffer D; Bruker Nano Surfaces, Minneapolis, Minnesota 55344, United States., Guo H; Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States.; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Warren OL; Bruker Nano Surfaces, Minneapolis, Minnesota 55344, United States., Adam J; Mads Clausen Institute, NanoSYD, University of Southern Denmark, Alsion 2, DK-6400 Sønderborg, Denmark., Kienle L; Institute for Materials Science, Kiel University, Kaiserstraße 2, D-24143 Kiel, Germany., Minor AM; Department of Materials Science and Engineering, University of California Berkeley, Berkeley, California 94720, United States.; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States., Adelung R; Institute for Materials Science, Kiel University, Kaiserstraße 2, D-24143 Kiel, Germany., Mishra YK; Institute for Materials Science, Kiel University, Kaiserstraße 2, D-24143 Kiel, Germany.
Publikováno v:
ACS omega [ACS Omega] 2017 Jun 28; Vol. 2 (6), pp. 2985-2993. Date of Electronic Publication: 2017 Jun 28 (Print Publication: 2017).
Autor:
Bufford DC; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States., Stauffer D; Hysitron, Inc., Eden Prairie, Minnesota 55344, United States., Mook WM; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States., Syed Asif SA; Hysitron, Inc., Eden Prairie, Minnesota 55344, United States., Boyce BL; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States., Hattar K; Sandia National Laboratories , Albuquerque, New Mexico 87185, United States.
Publikováno v:
Nano letters [Nano Lett] 2016 Aug 10; Vol. 16 (8), pp. 4946-53. Date of Electronic Publication: 2016 Jul 05.