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pro vyhledávání: '"Doug, Vick"'
Publikováno v:
AIP Advances, Vol 10, Iss 10, Pp 105213-105213-5 (2020)
Multi-probe scanning tunneling microscopy can play a role in various electrical measurements and characterization of nanoscale objects. The consistent close placement of multiple probes relies on very sharp apexes with no other interfering materials
Externí odkaz:
https://doaj.org/article/f92eb6a5594d40779f8dccfbd36abd76
Autor:
Marek, Malac, Jesus Alejandro Marin, Calzada, Mark, Salomons, Darren, Homeniuk, Patrick, Price, Martin, Cloutier, Misa, Hayashida, Doug, Vick, Sean, Chen, Suliat, Yakubu, Zhengxu Darren, Wen, Marcus, Leeson, Mohammad, Kamal, Jason, Pitters, John, Kim, Xuanhao, Wang, Olivier, Adkin-Kaya, Ray, Egerton
Publikováno v:
Micron. 163:103362
We outline a public license (open source) electron microscopy platform, referred to as NanoMi. NanoMi offers a modular, flexible electron microscope platform that can be utilized for a variety of applications, such as microscopy education and develop