Direct Observation of the Surface Topography at High Temperature with SEM

Autor: Jerôme Mendonça, Renaud Podor, Xavier Carrier, Dorian Nogues, Antoine Candeias, H.P. Brau, J. Lautru, Xavier Le Goff, Mathias Barreau

Publikováno v: Microscopy and Microanalysis
Microscopy and Microanalysis, Cambridge University Press (CUP), 2020, 26 (3), pp.397-402. ⟨10.1017/S1431927620001348⟩
Microscopy and Microanalysis, 2020, 26 (3), pp.397-402. ⟨10.1017/S1431927620001348⟩

High-temperature scanning electron microscopy allows the direct study of the temperature behavior of materials. Using a newly developed heating stage, tilted images series were recorded at high temperature and 3D images of the sample surface were rec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ececa9e2fcc3aadd8355d10de938ce2
https://doi.org/10.1017/s1431927620001348