Block-level Bayesian diagnosis of analogue electronic circuits

Autor: Krishnan, Shaji, Kerkhoff, Hans G., Doornbosch, Klaas D., Brand, Rudi

Publikováno v: Design, Automation and Test in Europe Conference and Exhibition, DATE 2010, 8 March 2010 through 12 March 2010, Dresden, 1767-1772
Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, 1767-1772
STARTPAGE=1767;ENDPAGE=1772;TITLE=Design, Automation & Test in Europe Conference & Exhibition, DATE 2010

Daily experience with product designers, test and diagnosis engineers it is realized that the depth of interaction among them, ought be high for sucessfull diagnosis of analogue circuits. With this knowledge in mind, a responsibility was undertaken t

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