Zobrazeno 1 - 10
of 28
pro vyhledávání: '"Dongwan Seo"'
Publikováno v:
ACS Applied Nano Materials. 4:2167-2174
With the pandemic crisis and long-lasting air pollution, reuse of disposable filtering masks has been prevalent while not being recommended. Different aerosol exposure conditions such as an extende...
Autor:
Kyeongeun Lee, Jooyoun Kim, Tahmineh Hemmatian, Eugene Song, Jehyung Yi, Seojin Jung, Dongwan Seo
Publikováno v:
Polymers
Volume 13
Issue 1
Polymers, Vol 13, Iss 45, p 45 (2021)
Volume 13
Issue 1
Polymers, Vol 13, Iss 45, p 45 (2021)
In the outbreak of COVID-19, the extended wear of single-use, disposable respirators was inevitable due to limited supplies. As a respirator is front-line protection against particulate matter, including bioaerosol and droplets, a comprehensive under
Publikováno v:
Applied Surface Science. 399:523-534
Gallium antimonide (GaSb) and indium antimonide (InSb) have attracted strong attention as new channel materials for transistors due to their excellent electrical properties and lattice matches with various group III–V compound semiconductors. In th
Publikováno v:
Applied Surface Science. 371:129-138
Ge surfaces were etched by means of metal-assisted chemical etching (MaCE). The behavior of the MaCE reaction in diluted H 2 O 2 was compared with that of a conventional etchant of HF/H 2 O 2 /H 2 O mixture (FPM). Herein we first report that a pyrami
Publikováno v:
Science of Advanced Materials. 8:817-824
Publikováno v:
The Journal of Physical Chemistry C. 119:24774-24780
Gallium antimonide (GaSb) has an extremely high electron mobility and an excellent lattice match with various III–V ternary and quaternary compounds. In this study, the effect of wet-etching processes on the GaSb (001) surface was investigated, wit
Publikováno v:
Thin Solid Films. 591:289-294
In the solution-based preparation of CZTS (Cu 2 ZnSnS 4 ) thin films followed by a sulfurization process, a layer of MoS 2 is formed at the CZTS–Mo interface. Formation of this MoS 2 layer is mainly governed by the sulfurization process in H 2 S am
Publikováno v:
Applied Surface Science. 311:831-836
Introduction of a MoSi-based phase shift mask (PSM) improves photolithography resolution by causing light to shift phase by 180° thus canceling the overlap. However, when MoSiON PSM was exposed to an ArF excimer laser ( λ = 193 nm), a significant i
Publikováno v:
Journal of Materials Science: Materials in Electronics. 25:3420-3426
Cu2ZnSnS4 (CZTS) absorber layers were prepared from copper acetate, zinc acetate, tin chloride, and thiourea in a solution of methanol, ethylenediamine, and ethanolamine using a sol–gel spin-coating method. Sol–gel precursor solutions were prepar
Publikováno v:
Microelectronic Engineering. 118:66-71
Various additives were added to H"3PO"4 in order to achieve a highly selective wet etching of Si"3N"4 to SiO"2. Fluoride compounds such as HF, NH"4F, and NH"4HF"2 were added to the H"3PO"4 in order to increase the etch rate of the Si"3N"4. In additio