Výsledky vyhledávání - "Dongmin Kyeon"

Semiconductor device metrology for detecting defective chip due to high-aspect ratio-based structures using hyperspectral imaging and deep learning

Autor: Sunhong Jun, Wonjun Choi, DongHoon Kim, Hayan Park, Dongmin Kyeon, Kyounghwan Lee, Yong-Ju Jeon, Chaemin Lee, Kwangchul Kim, Jeongsu Han, Sungyoon Ryu, Younghoon Sohn, Yongdeok Jeong

Publikováno v: Metrology, Inspection, and Process Control XXXVII.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a829ed44f146688783070c04d8235780
https://doi.org/10.1117/12.2657062

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