Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Dongkwan Han"'
Autor:
Dong Hyun Jang, Joonghee Kim, Dongkwan Han, Ji Eun Hwang, You Hwan Jo, Jae Hyuk Lee, Inwon Park, Bora Kang
Publikováno v:
Int Wound J
It is not easy to ensure optimal prevention of hospital‐acquired pressure ulcer (HAPU) in crowded emergency departments (EDs). We hypothesised that a prolonged ED length of stay (LOS) is associated with an increased risk of HAPU. This is a single
Publikováno v:
JSTS:Journal of Semiconductor Technology and Science. 12:293-296
SOC test methodology in ultra deep submicron (UDSM) technology with reasonable test time and cost has begun to satisfy high quality and reliability of the product. A novel hierarchical test architecture using IEEE standard 1149.1, 1149.7 and 1500 com
Autor:
Janusz Rajski, Yu Huang, Jihye Kim, Dongkwan Han, Kun Young Chung, Mark Kassab, Jay Jahangiri, Wu-Tung Cheng
Publikováno v:
NATW
This paper proposes an innovative test compression technology for system-on-chip (SoC) designs to share scan input channels across multiple cores which use EDT [1] compression. A new DFT compression architecture is proposed to separate control and da
Publikováno v:
ETRI Journal; Apr2014, Vol. 36 Issue 2, p293-300, 8p