Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Dong-Zhen Lee"'
Publikováno v:
2022 Design, Automation & Test in Europe Conference & Exhibition (DATE).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::86ce0213ebdbc89555818a687fcba2be
https://doi.org/10.23919/date54114.2022.9774502
https://doi.org/10.23919/date54114.2022.9774502
Autor:
Kai-Chiang Wu, Yu-Teng Nien, Mango C.-T. Chao, Ying-Yen Chen, Shu-Yi Kao, Dong-Zhen Lee, Mason Chern, Chen Po-Lin, Jih-Nung Lee
Publikováno v:
ITC
In order to reduce DPPM (defect parts per million), cell-aware (CA) methodology was proposed to cover various types of intra-cell defects. The resulting CA faults can be a 1-time-frame (1tf) or 2-time-frame (2tf) fault, and 2tf CA tests were experime
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4c9fef8c7b2480ca5f9a96144a6e6d65
https://doi.org/10.1109/itc44170.2019.9000119
https://doi.org/10.1109/itc44170.2019.9000119