Zobrazeno 1 - 10
of 54
pro vyhledávání: '"Dong-Shong Liang"'
Autor:
Dong-Shong Liang, 梁東雄
97
Most of the previously published negative-differential-resistance circuits (NDR) are implemented by the resonant tunneling diode (RTD). These devices and circuits are Ⅲ-Ⅴ compound semiconductors, which are not compatible with the main str
Most of the previously published negative-differential-resistance circuits (NDR) are implemented by the resonant tunneling diode (RTD). These devices and circuits are Ⅲ-Ⅴ compound semiconductors, which are not compatible with the main str
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/66458530406168358510
Publikováno v:
IEICE Transactions on Electronics. :86-92
Publikováno v:
Analog Integrated Circuits and Signal Processing. 70:141-145
The behavior of a novel frequency divider circuit using negative differential resistance (NDR) circuit is studied. This NDR circuit is made of resistors (R) and bipolar-junction-transistor (BJT) devices. It can show the NDR characteristic in its comb
Autor:
Dong-Shong Liang, Kwang-Jow Gan
Publikováno v:
IEICE Transactions on Electronics. :514-520
A multiple-peak negative differential resistance (NDR) circuit made of standard Si-based metal-oxide-semiconductor field-effect-transistor (MOS) and SiGe-based heterojunction bipolar transistor (HBT) is demonstrated. We can obtain a three-peak I-V cu
Publikováno v:
IEICE Transactions on Information and Systems. :2068-2072
The paper demonstrates a novel multiple-valued logic (MVL) design using a three-peak negative differential resistance (NDR) circuit, which is made of several Si-based metal-oxide-semiconductor field-effect-transistor (MOS) and SiGe-based heterojuncti
Publikováno v:
Analog Integrated Circuits and Signal Processing. 62:63-68
We investigate four novel negative-differential-resistance (NDR) circuits using the combination of the standard Si-based n-channel metal-oxide-semiconductor field-effect-transistor (NMOS) and SiGe-based heterojunction bipolar transistor (HBT). By sui
Publikováno v:
IEICE Transactions on Electronics. :635-638
The paper demonstrates a novel two-peak negative differential resistance (NDR) circuit combining Si-based metal-oxide-semiconductor field-effect-transistor (MOS) and SiGe-based heterojunction bipolar transistor (HBT). Compared to the resonant-tunneli
Publikováno v:
Analog Integrated Circuits and Signal Processing. 59:161-167
A novel multiple-selected and multiple-valued memory (MSMVM) design using the negative differential resistance (NDR) circuits is demonstrated. The NDR circuits are made of Si-based metal-oxide-semiconductor field-effect-transistor (MOS) and SiGe-base
Publikováno v:
Solid-State Electronics. 52:882-885
The design of a four-valued multiplexer using the negative differential resistance (NDR) circuit is demonstrated. The NDR circuit used in this work is made of the Si-based metal–oxide–semiconductor field-effect-transistor (MOS) and the SiGe-based
Publikováno v:
Solid-State Electronics. 52:175-178
A multiple-input NOR logic gate using the negative differential resistance (NDR) circuit is demonstrated. The NDR circuit is composed of four resistors (R) and two SiGe-based heterojunction bipolar transistor (HBT), and it can show the NDR characteri