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Autor:
Dominic Flach, J.1 dominic.flach@vexcel.co.uk, Partington, Kim C.1 kim.partington@vexcel.co.uk, Ruiz, Christian2 Christian.miz@noveltis.fr, Jeansou, Eric2 eric.jeansou@noveltis.fr, Drinkwater, Mark R.3 Mark.Drinkwater@esa.mt
Publikováno v:
IEEE Transactions on Geoscience & Remote Sensing. Apr2005, Vol. 43 Issue 4, p743-752. 10p.
