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pro vyhledávání: '"Domingos, Moabe Ferreira"'
Autor:
Domingos, Moabe Ferreira
Publikováno v:
Repositório Institucional da Universidade Federal do Ceará (UFC)
Universidade Federal do Ceará (UFC)
instacron:UFC
Universidade Federal do Ceará (UFC)
instacron:UFC
Due to the shrinkage of the integrated devices, memories have a high probability of presenting multiple bit upset, corrupting the stored data, representing a real concern for critical applications, in which data reliability is a necessity. Therefore,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3056::e39d401d2fbbe0c7a4d64e592cdeb4b3
http://www.repositorio.ufc.br/handle/riufc/56844
http://www.repositorio.ufc.br/handle/riufc/56844
