Zobrazeno 1 - 10
of 35
pro vyhledávání: '"Dolar Khachariya"'
Autor:
Rohan Sengupta, Shipra Vaidya, Dennis Szymanski, Dolar Khachariya, Michal Bockowski, Grzegorz Kamler, Pramod Reddy, Zlatko Sitar, Ramón Collazo, Spyridon Pavlidis
Publikováno v:
ACS Applied Nano Materials. 6:5081-5086
Autor:
Pramod Reddy, James Loveless, Cristyan Quinones-Garcia, Dolar Khachariya, Ronny Kirste, Spyridon Pavlidis, Will Mecouch, Seiji Mita, Baxter Moody, James Tweedie, Erhard Kohn, Ramon Collazo, Zlatko Sitar
Publikováno v:
2022 Compound Semiconductor Week (CSW).
Autor:
Shashwat Rathkanthiwar, Pramod Reddy, Baxter Moody, Cristyan Quiñones-García, Pegah Bagheri, Dolar Khachariya, Rafael Dalmau, Seiji Mita, Ronny Kirste, Ramón Collazo, Zlatko Sitar
Publikováno v:
Applied Physics Letters. 122:152105
High p-conductivity (0.7 Ω−1 cm−1) was achieved in high-Al content AlGaN via Mg doping and compositional grading. A clear transition between the valence band and impurity band conduction mechanisms was observed. The transition temperature depend
Autor:
Pegah Bagheri, Cristyan Quiñones-Garcia, Dolar Khachariya, James Loveless, Yan Guan, Shashwat Rathkanthiwar, Pramod Reddy, Ronny Kirste, Seiji Mita, James Tweedie, Ramón Collazo, Zlatko Sitar
Publikováno v:
Applied Physics Letters. 122:142108
Highly conductive Ge-doped AlN with conductivity of 0.3 (Ω cm)−1 and electron concentration of 2 × 1018 cm−3 was realized via a non-equilibrium process comprising ion implantation and annealing at a moderate thermal budget. Similar to a previou
Autor:
Shane R. Stein, Dolar Khachariya, Seiji Mita, M. Hayden Breckenridge, James Tweedie, Pramod Reddy, Kacper Sierakowski, Grzegorz Kamler, Michał Boćkowski, Erhard Kohn, Zlatko Sitar, Ramón Collazo, Spyridon Pavlidis
Publikováno v:
Applied Physics Express. 16:031006
We investigate the electrical characteristics of Ni Schottky contacts on n-type GaN films that have undergone ultra-high-pressure annealing (UHPA), a key processing step for activating implanted Mg. Contacts deposited on these films exhibit low recti
Autor:
Dolar Khachariya, Seiji Mita, Pramod Reddy, Saroj Dangi, J. Houston Dycus, Pegah Bagheri, M. Hayden Breckenridge, Rohan Sengupta, Shashwat Rathkanthiwar, Ronny Kirste, Erhard Kohn, Zlatko Sitar, Ramón Collazo, Spyridon Pavlidis
Publikováno v:
Applied Physics Letters. 120
The ultra-wide bandgap of Al-rich AlGaN is expected to support a significantly larger breakdown field compared to GaN, but the reported performance thus far has been limited by the use of foreign substrates. In this Letter, the material and electrica
Autor:
Dolar Khachariya, Dennis Szymanski, Pramod Reddy, Erhard Kohn, Zlatko Sitar, Ramón Collazo, Spyridon Pavlidis
Publikováno v:
Applied Physics Letters. 120
In this Letter, we unveil the high-temperature limits of N-polar GaN Schottky contacts enhanced by a low-pressure chemical vapor deposited (LPCVD) SiN interlayer. Compared to conventional Schottky diodes, the insertion of a 5 nm SiN lossy dielectric
Autor:
Pramod Reddy, Zlatko Sitar, Erhard Kohn, Ramon Collazo, Dolar Khachariya, Spyridon Pavlidis, Dennis Szymanski
Publikováno v:
ECS Transactions. 98:69-79
GaN devices offer exciting competition to incumbent technologies to meet the growing demand for high power electronic devices. The wide bandgap of GaN makes it possible to achieve higher breakdown voltages and reduced on-resistances compared to tradi
Autor:
Shashwat Rathkanthiwar, Pegah Bagheri, Dolar Khachariya, Seiji Mita, Cristyan Quiñones-García, Yan Guan, Baxter Moody, Pramod Reddy, Ronny Kirste, Ramón Collazo, Zlatko Sitar
Publikováno v:
Applied Physics Letters. 122:092103
Record-low p-type resistivities of 9.7 and 37 Ω cm were achieved in Al0.7Ga0.3N and Al0.8Ga0.2N films, respectively, grown on single-crystal AlN substrate by metalorganic chemical vapor deposition. A two-band conduction model was introduced to expla
Autor:
Pegah Bagheri, Cristyan Quiñones-Garcia, Dolar Khachariya, Shashwat Rathkanthiwar, Pramod Reddy, Ronny Kirste, Seiji Mita, James Tweedie, Ramón Collazo, Zlatko Sitar
Publikováno v:
Journal of Applied Physics. 132:185703
High room temperature n-type mobility, exceeding 300 cm2/Vs, was demonstrated in Si-doped AlN. Dislocations and CN−1 were identified as the main compensators for AlN grown on sapphire and AlN single crystalline substrates, respectively, limiting th