Position and Mode Dependent Optical Detection Back-Action in Cantilever Beam Resonators

Autor: Schmid, T. Larsen. S., Dohn, S., Sader, J. E., Boisen, A., Villanueva, L. G.

Publikováno v: J. Micromech. Microeng. 27 035006 (2017)

Optical detection back-action in cantilever resonant or static detection presents a challenge when striving for state-of-the-art performance. The origin and possible routes for minimizing optical back-action have received little attention in literatu

Externí odkaz: http://arxiv.org/abs/1702.07102

Measurement of the resonant frequency of nano-scale cantilevers by hard contact readout

Autor: Dohn, S., Hansen, O., Boisen, A.

Publikováno v: In Microelectronic Engineering May-June 2008 85(5-6):1390-1394

Multi-walled carbon nanotubes integrated in microcantilevers for application of tensile strain

Autor: Dohn, S., Kjelstrup-Hansen, J., Madsen, D.N., Mølhave, K., Bøggild, P.

Publikováno v: In Ultramicroscopy 2005 105(1):209-214

“SU8 based microcantilever sensors chemically functionalized with organic-capped oxidenanocrystals for vapour detection”

Autor: Ingrosso C., Sardella E., Keller S., Dohn S., Striccoli M., Agostiano A., Boisen A., Curri M. L.

Publikováno v: 37th International Conference on Micro and Nano Engineering (MNE), Berlin (Germany), 2011
info:cnr-pdr/source/autori:Ingrosso C., Sardella E., Keller S., Dohn S., Striccoli M., Agostiano A., Boisen A., Curri M. L./congresso_nome:37th International Conference on Micro and Nano Engineering (MNE)/congresso_luogo:Berlin (Germany)/congresso_data:2011/anno:2011/pagina_da:/pagina_a:/intervallo_pagine

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=cnr_________::bbc9c41b0141195009215f908af1a489
http://www.cnr.it/prodotto/i/117374

Integrated tunneling sensor for nanoelectromechanical systems

Autor: Sadewasser, Sascha, Abadal Berini, Gabriel, Barniol i Beumala, Núria, Dohn, S., Boisen, A., Fonseca Chácharo, Luis Antonio, Esteve, Jaume, American Physical Society

Publikováno v: Sadewasser, S, Abadal, G, Barniol, N, Dohn, S & Boisen, A 2006, ' Integrated tunneling sensor for nanoelectromechanical systems ', Applied Physics Letters, vol. 89, no. 17, pp. 173101 . https://doi.org/10.1063/1.2362593
Dipòsit Digital de Documents de la UAB
Universitat Autònoma de Barcelona

In view of the outstanding performance of polycrystalline thin film solar cells on the basis of Cu Ia Se2, the electrical activity at grain boundaries currently receives considerable attention. Recently, Kelvin probe force microscopy KPFM has been ap

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::23d9bfe9f8c21757959b01d23b598172
https://orbit.dtu.dk/en/publications/6cc3aaa5-9e2e-40a0-9eea-c18ba23104b4