An ultra-thin bendable Si-monolithic imaging test sensor.

Autor: Dogiamis, G. C., Hafner, J., Mokwa, W., Hosticka, B. J., Grabmaier, A.

Publikováno v: 2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators & Microsystems (TRANSDUCERS & EUROSENSORS XXVII); 2013, p964-967, 4p