Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Do-Gyeom Jeong"'
Autor:
Alexandr Cocemasov, Vladimir Brinzari, Do-Gyeom Jeong, Ghenadii Korotcenkov, Sergiu Vatavu, Jong S. Lee, Denis L. Nika
Publikováno v:
Nanomaterials, Vol 11, Iss 5, p 1126 (2021)
We report on a comprehensive theoretical and experimental investigation of thermal conductivity in indium-tin-oxide (ITO) thin films with various Ga concentrations (0–30 at. %) deposited by spray pyrolysis technique. X-ray diffraction (XRD) and sca
Externí odkaz:
https://doaj.org/article/8349c71c9fcf452d8c9d978d9267384f
Autor:
Young Jin Jeong, Do Gyeom Jeong, Hwiin Ju, In Hyeok Choi, Chang Jae Roh, Jin Hong Lee, Chan-Ho Yang, Jong Seok Lee
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-7 (2024)
Abstract We investigated the multi-domain states of a multiferroic La-doped BiFeO3 (BLFO) thin film by examining diffraction patterns in optical second-harmonic generation (SHG) measurement. By directing a laser onto the domain wall within the domain
Externí odkaz:
https://doaj.org/article/6bed2b7ade8d43a699228a61d7f55561
Autor:
Ghenadii Korotcenkov, Alexandr I. Cocemasov, Denis L. Nika, Vladimir Brinzari, Jong Seok Lee, Sergiu Vatavu, Do-Gyeom Jeong
Publikováno v:
Nanomaterials
Nanomaterials, Vol 11, Iss 1126, p 1126 (2021)
Nanomaterials; Volume 11; Issue 5; Pages: 1126
Nanomaterials, Vol 11, Iss 1126, p 1126 (2021)
Nanomaterials; Volume 11; Issue 5; Pages: 1126
We report on a comprehensive theoretical and experimental investigation of thermal conductivity in indium-tin-oxide (ITO) thin films with various Ga concentrations (0-30 at. %) deposited by spray pyrolysis technique. X-Ray diffraction (XRD) and scann
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::24042dbfb13154b9de8eddc8f66e4361
http://arxiv.org/abs/2105.00062
http://arxiv.org/abs/2105.00062
Autor:
Bongjin Simon Mun, Chang Jae Roh, Hwiin Ju, Jong Seok Lee, Do-Gyeom Jeong, Young-Gwan Choi, Geonhwa Kim, Sang-Woo Kim, Tae Yun Kim
Publikováno v:
Scientific Reports
Scientific Reports, Vol 9, Iss 1, Pp 1-8 (2019)
Scientific Reports, Vol 9, Iss 1, Pp 1-8 (2019)
In nano-device applications using 2D van der Waals materials, a heat dissipation through nano-scale interfaces can be a critical issue for optimizing device performances. By using a time-domain thermoreflectance measurement technique, we examine a cr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::118f2593a6e6878a327923b72d7c0d2a
https://doi.org/10.1038/s41598-019-44091-9
https://doi.org/10.1038/s41598-019-44091-9
Autor:
Jong Seok Lee, Soonmin Kang, Bong-Joong Kim, Wan-Gil Jung, Myung Joon Han, Young-Gwan Choi, Suhan Son, Hwiin Ju, Je-Geun Park, Myung-Chul Jung, Do-Gyeom Jeong
Publikováno v:
Applied Physics Letters. 117:063103
We investigated the thermal transport properties of magnetic van der Waals materials, TMPS3 (TM = Mn, Ni, and Fe), using the time-domain thermoreflectance technique. We determined the cross-plane thermal conductivity, which turns out to be relatively
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f32e7efcfe13cfcc3e0365f501ab4db1
https://doi.org/10.1063/5.0013107
https://doi.org/10.1063/5.0013107
Autor:
Do-Gyeom Jeong, Hwiin Ju, Young-Gwan Choi, Woo Seok Choi, Jung-Pil Lee, Sungmin Woo, Chang Jae Roh
Publikováno v:
Nanotechnology. 30:374001
A SrRuO3 thin film has been widely used as a metal electrode in electronic devices based on transition metal oxides, and hence it is important to understand its thermal transport properties to minimize a thermal degradation problem during the device
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4847ed99ef3676a342f6de1a8058d3f3
https://doi.org/10.1088/1361-6528/ab280d
https://doi.org/10.1088/1361-6528/ab280d