Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Dmytro Petryk"'
Publikováno v:
2022 IEEE 23rd Latin American Test Symposium (LATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f568d35dd6cb738758af8bd9fc83e611
https://doi.org/10.1109/lats57337.2022.9936987
https://doi.org/10.1109/lats57337.2022.9936987
Publikováno v:
International Journal of Human Movement and Sports Sciences. 9:308-315
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af3fe1ff824e249efacc6ff53b6a3668
https://doi.org/10.13189/saj.2021.090219
https://doi.org/10.13189/saj.2021.090219
Autor:
Dmytro Petryk
Publikováno v:
Humanities science current issues. 3:170-174
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5074b78963293511e8d4a2bd763fa00f
https://doi.org/10.24919/2308-4863/36-3-29
https://doi.org/10.24919/2308-4863/36-3-29
Publikováno v:
DSD
If devices are physically accessible optical fault injection attacks pose a great threat since the data processed as well as the operation flow can be manipulated. Successful physical attacks may lead not only to leakage of secret information such as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e8ad0a5d6b0f41c1b31a82eef1edb72b
https://doi.org/10.1109/dsd53832.2021.00062
https://doi.org/10.1109/dsd53832.2021.00062
Publikováno v:
2020 9th Mediterranean Conference on Embedded Computing (MECO)
The IoT consists of a lot of devices such as embedded systems, wireless sensor nodes (WSNs), control systems, etc. It is essential for some of these devices to protect information that they process and transmit. The issue is that an adversary may ste
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a49ed4ac8b3ac47a94a6e940005e2f33
http://arxiv.org/abs/2103.12433
http://arxiv.org/abs/2103.12433
Publikováno v:
2020 IEEE East-West Design & Test Symposium (EWDTS)
Physically accessible devices such as sensor nodes in Wireless Sensor Networks or "smart" devices in the Internet of Things have to be resistant to a broad spectrum of physical attacks, for example to Side Channel Analysis and to Fault Injection atta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bffad61c9ccf357f692a72ffe0ddbd55
Autor:
Nevin George, Guilherme Cardoso Medeiros, Junchao Chen, Josie Esteban Rodriguez Conda, Thomas Lange, Aleksa Damljanovic, Raphael Segabinazzi Ferreira, Aneesh Balakrishnan, Xinhui (Anna) Lai, Shayesteh Masoumian, Dmytro Petryk, Troya Cagil Koylu, Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Cemil Cem Gürsoy, Said Hamdioui, Mottaqiallah Taouil, Milos Krstic, Peter Langendoerfer, Zoya Dyka, Marcelo Brandalero, Michael Hübner, Jörg Nolte, Heinrich Theodor Vierhaus, Matteo Sonza Reord, Giovanni Squillero, Luca Sterpone, Jaan Raik, Dan Alexandrescu, Maximilien Glorieux, Georgios Selimis, Geert-Jan Schrijen, Anton Klotz, Christian Sauer, Maksim Jenihhin
The demonstrator highlights the various interdependent aspects of Reliability, Security and Quality in nanoelectronics system design within an EDA toolset and a processor architecture setup. The compelling need of attention towards these three aspect
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::861be548967445da682d3197a01a7d8a
Autor:
Dmytro Petryk, Peter Langendörfer, Ievgen Kabin, Eduardo Perez, Jens Katzer, Zoya Dyka, Jan Schaffner
Publikováno v:
Microprocessors and Microsystems. 87:104376
Today, the technology of resistive random access memory is used as a non-volatile memory. In this paper we investigate in details the sensitivity of the TiN/Ti/Al:HfO2/TiN-based 1T-1R resistive random access memory cells implemented in a 250 nm CMOS
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6dd1d38d0bd6a3ccb36123b8a5341eb
https://doi.org/10.1016/j.micpro.2021.104376
https://doi.org/10.1016/j.micpro.2021.104376
Autor:
Ievgen Kabin, Peter Langendoerfer, Dmytro Petryk, Eduardo Perez, Christian Wenger, Mamathamba Kalishettyhalli Mahadevaiaha, Zoya Dyka
Publikováno v:
2020 23rd Euromicro Conference on Digital System Design (DSD)
Resistive Random Access Memory (RRAM) is a type of Non-Volatile Memory (NVM). In this paper we investigate the sensitivity of the TiN/Ti/Al:HfO2/TiN-based 1T-1R RRAM cells implemented in a 250 nm CMOS IHP technology to the laser irradiation in detail
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a5926d2055237ea3b150fdb4aeeee2ca