Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Dmitry O. Titovets"'
Autor:
Alexander I. Chumakov, Armen V. Sogoyan, Dmitry V. Bobrovsky, Dmitry O. Titovets, Konstantin A. Chumakov, Sergey Y. Diankov, Vitaly V. Khaustov, Oleg A. Gerasimchuk, Dmitry I. Yurkov
Publikováno v:
Безопасность информационных технологий, Vol 28, Iss 2, Pp 34-43 (2021)
Some features of dominant radiation effects in modern ICs of information, information-computing and control systems when exposed to neutrons are analysed. Occurrence of all main dominant radiation effects in ICs is possible under influence of neutron
Externí odkaz:
https://doaj.org/article/8990912f904e48ba9156d1b1842dffd2
Autor:
Dmitry O. Titovets, Nikolay D. Kravchenko, Andrey B. Karakozov, Alexander I. Chumakov, Dmitry V. Bobrovsky
Publikováno v:
Безопасность информационных технологий, Vol 27, Iss 3, Pp 89-97 (2020)
The development of the technological process in electronics has led to the problem of single event upsets (SEU) in microchips when exposed to neutrons causing loss of information and errors. To evaluate sensitivity of CMOS VLSI to SEU caused by neutr
Externí odkaz:
https://doaj.org/article/d11d1fbe1fa34dd7ac37c6120cffcb22
Autor:
Nikolay D. Kravchenko, Alexander I. Chumakov, Dmitry O. Titovets, D. V. Bobrovsky, Andrey B. Karakozov
Publikováno v:
Bezopasnostʹ Informacionnyh Tehnologij, Vol 27, Iss 3, Pp 89-97 (2020)
The development of the technological process in electronics has led to the problem of single event upsets (SEU) in microchips when exposed to neutrons causing loss of information and errors. To evaluate sensitivity of CMOS VLSI to SEU caused by neutr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7006d9e8573222181357706ba1b4eec0
https://bit.mephi.ru/index.php/bit/article/view/1295
https://bit.mephi.ru/index.php/bit/article/view/1295