Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Dmitry O. Smirnov"'
Autor:
Michael S. Afanasiev, Alexey V. Bespalov, Andrey A. Geraskin, Olga L. Golykova, Dmitry V. Kulikov, Alexandra A. Muravyeva, Dmitry O. Smirnov, Igor A. Kharitonov, Ruslan S. Shabardin
Publikováno v:
Безопасность информационных технологий, Vol 30, Iss 3, Pp 116-125 (2023)
The process of recrystallization occurring at temperature of +80°C in aluminum (Al) conductors of integrated circuits (IC) designed to operate in the range -40°C -+60°C has been studied experimentally by the method of cross sections obtained with
Externí odkaz:
https://doaj.org/article/ce988462bf164b86aa6d445305614a4b
Autor:
Dmitry O. Smirnov
Publikováno v:
Безопасность информационных технологий, Vol 29, Iss 2, Pp 128-143 (2022)
In the presence of technological dependence, it is impossible to abandon the use of untrusted electronic component base products, and in some cases it is impractical. Existing technologies allow for structural and technological modifications that may
Externí odkaz:
https://doaj.org/article/ecd0747356c64e47b9d96544da53fa5e
Publikováno v:
Безопасность информационных технологий, Vol 29, Iss 2, Pp 10-19 (2022)
The use of foreign computer-aided design (CAD) systems and debugging of IP-blocks in the development of ultra-large integrated circuits (VLSI) are associated with the risks of the appearance of "Trojans", not declared by developers of software and fi
Externí odkaz:
https://doaj.org/article/37c0a0921c5a457482b552bc5c70633b