Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Dmitriy V. Savchenkov"'
Publikováno v:
2021 International Siberian Conference on Control and Communications (SIBCON).
a division of labor plays significant role in the efficiency of laser SEE Testing. The highest efficiency can be achieved when testers fulfill their roles in a global task: one is engaged in debugging and monitoring the testing progress at the facili
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22eddb286ebbffe6c66e66b4e54ec541
https://doi.org/10.1109/sibcon50419.2021.9438870
https://doi.org/10.1109/sibcon50419.2021.9438870
Autor:
Dmitry V. Boychenko, A. N. Egorov, Alexander A. Pechenkin, O. B. Mavritskii, Dmitriy V. Savchenkov
Publikováno v:
Optical Sensing and Detection VI.
Singe event effect (SEE) simulation in modern integrated circuits (ICs) by femtosecond laser irradiation through the substrate allows eliminating a lot of problems connected to the presence of multiple opaque metal layers above the IC active layer. W
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f6f6a57a0ebc57f34678be041b6fe6d
https://doi.org/10.1117/12.2555772
https://doi.org/10.1117/12.2555772
Autor:
A. N. Egorov, Alexander A. Pechenkin, Alexander I. Chumakov, O. B. Mavritskii, Dmitriy V. Savchenkov
Publikováno v:
Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XVIII.
The advances of the picosecond and femtosecond laser installations utilization for radiation hardness evaluation of semiconductor electronics for space applications are presented. The modern “local laser irradiation” method for single event effec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb6c00b7b5fa7ee93e7f1d0a5855f74b
https://doi.org/10.1117/12.2288364
https://doi.org/10.1117/12.2288364
Publikováno v:
IEEE Transactions on Nuclear Science. 62:195-201
Numerical and experimental evaluation of the influence of laser radiation polarization orientation on ionization response of 180-nm and 90-nm CMOS ICs is performed. Comparative research is carried out to determine how the polarization of various size
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::75158ddde868c8cb8c7c63b87f896b44
https://doi.org/10.1109/tns.2014.2387441
https://doi.org/10.1109/tns.2014.2387441
Autor:
O. B. Mavritskii, Dmitriy V. Savchenkov, Alexander A. Pechenkin, Alexandra V. Gordienko, A. N. Egorov
Publikováno v:
SPIE Proceedings.
The installations for laser testing of microelectronic elements (first of all - integrated circuits) of devices for space applications for hardness to local radiation effects from heavy charged particles are presented. The possibility of a focused pu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::184a3151d0715dcc146f31e39898d816
https://doi.org/10.1117/12.2079758
https://doi.org/10.1117/12.2079758
Autor:
Andrey V. Yanenko, Vitaliy A. Telets, Alexander I. Chumakov, A. N. Egorov, Alexander A. Pechenkin, Oleg B. Mavritskiy, Dmitriy V. Savchenkov
Publikováno v:
2014 IEEE Radiation Effects Data Workshop (REDW).
The new SEE laser simulation facility based on femtosecond laser source with tunable pulse duration is presented, and its most important features are discussed. The influence of laser pulse duration on simulation results is observed.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78eb44a21473e7795e120937b9d15e4b
https://doi.org/10.1109/redw.2014.7004570
https://doi.org/10.1109/redw.2014.7004570