Zobrazeno 1 - 2
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pro vyhledávání: '"Djamel Ghaffor"'
Autor:
Zakia Lounis, Amira Derri, M’hamed Bouslama, Abdelkrim Mahfoud, Amel Hadj-Kaddour, Chawki Zegadi, Djamel Ghaffor
Publikováno v:
Journal of Materials Science: Materials in Electronics. 31:10213-10224
Point defect properties of three samples of tin-oxide are analyzed in a comparative two stages study (before and after treatments), using Auger spectroscopy (AES) and Photoluminescence (PL). Samples 1 and 2 are thin films and sample 3 is a massif one
Autor:
M’hamed Gazzoul, Abdelhak Baizid, Djamel Ghaffor, M’hamed Bouslama, F. Besahraoui, Zakia Lounis, Bachir Kharroubi, Abdallah Ouerdane, M. Salah Halati, Choucki Zegadi
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 226:9-16
SnO2 thin films are materials with surfaces sensitive to the processes of elaboration, synthesis and post-synthesis treatments for different technology applications. The main objective of the present work is to investigate three samples issued from s