Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Djamel Ghaffor"'
Autor:
Zakia Lounis, Amira Derri, M’hamed Bouslama, Abdelkrim Mahfoud, Amel Hadj-Kaddour, Chawki Zegadi, Djamel Ghaffor
Publikováno v:
Journal of Materials Science: Materials in Electronics. 31:10213-10224
Point defect properties of three samples of tin-oxide are analyzed in a comparative two stages study (before and after treatments), using Auger spectroscopy (AES) and Photoluminescence (PL). Samples 1 and 2 are thin films and sample 3 is a massif one
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c56af5a1e8d22af5630ddf576baf4f8b
https://doi.org/10.1007/s10854-020-03567-5
https://doi.org/10.1007/s10854-020-03567-5
Autor:
M’hamed Gazzoul, Abdelhak Baizid, Djamel Ghaffor, M’hamed Bouslama, F. Besahraoui, Zakia Lounis, Bachir Kharroubi, Abdallah Ouerdane, M. Salah Halati, Choucki Zegadi
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 226:9-16
SnO2 thin films are materials with surfaces sensitive to the processes of elaboration, synthesis and post-synthesis treatments for different technology applications. The main objective of the present work is to investigate three samples issued from s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::85139eb1175d7d08dc4d0ec3faaeb5e4
https://doi.org/10.1016/j.elspec.2018.04.006
https://doi.org/10.1016/j.elspec.2018.04.006
Autor:
Ghaffor, Djamel, Lounis, Zakia, Zegadi, Chawki, Mahfoud, Abdelkrim, Derri, Amira, Hadj-Kaddour, Amel, Bouslama, M'hamed
Publikováno v:
Journal of Materials Science: Materials in Electronics; Jul2020, Vol. 31 Issue 13, p10213-10224, 12p