Zobrazeno 1 - 10
of 117
pro vyhledávání: '"Dixson, R."'
Publikováno v:
Proceedings of SPIE; Nov2009 Part 3, Issue 1, p73900P-73900P-12, 12p
Autor:
Bodermann, B., Bergmann, D., Buhr, E., Hässler-Grohne, W., Bosse, H., Potzick, J., Dixson, R., Quintanilha, R., Stocker, M., Vladar, A., Orji, N. G.
Publikováno v:
Proceedings of SPIE; Nov2009 Part 3, Issue 1, p74881H-74881H-14, 14p
Autor:
Silver, R. M., Zhang, N. F., Barnes, B. M., Zhou, H., Heckert, A., Dixson, R., Germer, T. A., Bunday, B.
Publikováno v:
Proceedings of SPIE; Nov2009, Issue 1, p727202-727202-14, 14p
Publikováno v:
Proceedings of SPIE; Nov2008 Part 2, Issue 1, p69221M-69221M-12, 12p
Publikováno v:
Proceedings of SPIE; Nov2008 Part 2, Issue 1, p70420A-70420A-11, 11p
Autor:
Potzick, J., Dixson, R., Quintanilha, R., Stocker, M., Vladar, A., Buhr, E., Häßler-Grohne, W., Bodermann, B., Frase, C. G., Bosse, H.
Publikováno v:
Proceedings of SPIE; Nov2008 Part 2, Issue 1, p71222P-71222P-14, 14p
Autor:
Park, B. C., Choi, J., Ahn, S. J., Kim, D-H, Lyou, J., Dixson, R., Orji, N. G., Fu, J., Vorburger, T. V.
Publikováno v:
Proceedings of SPIE; Nov2007, Issue 1, p651819-651819-14, 14p
Study of Test Structures for Use as Reference Materials for Optical Critical Dimension Applications.
Autor:
Allen, R.A., Patrick, H.J., Bishop, M., Germer, T.A., Dixson, R., Guthrie, W.F., Cresswell, W.
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p20-25, 6p
Autor:
Silver, R. M., Barnes, B. M., Attota, R., Jun, J., Filliben, J., Soto, J., Stocker, M., Lipscomb, P., Marx, E., Patrick, H. J., Dixson, R., Larrabee, R.
Publikováno v:
Proceedings of SPIE; Nov2006 Part 2, Issue 1, p61520Z-61520Z-15, 15p
Autor:
Cresswell, M. W., Dixson, R. G., Guthrie, W. F., Allen, R. A., Murabito, C. E., Park, B., Martinez de Pinillos, J. V., Hunt, A.
Publikováno v:
Proceedings of SPIE; Nov2005, Issue 1, p288-303, 16p