TOP-CT: Trajectory With Overlapping Projections X-Ray Computed Tomography

Autor: Dirk Elias Schut, Kees Joost Batenburg, Robert van Liere, Tristan van Leeuwen

Publikováno v: IEEE Transactions on Computational Imaging, 8, 598-608. Institute of Electrical and Electronics Engineers
IEEE Transactions on Computational Imaging, 8, 598-608

TOP-CT (Trajectory with Overlapping Projections X-ray Computed Tomography) is a new class of CT scanning geometries for high throughput industrial CT scanning. In TOP-CT multiple objects move with a constant spacing over the same trajectory between a

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https://research.tue.nl/nl/publications/8c80960f-fa84-45e2-8d5a-d7824c9bb831