A variable probe pitch micro-Hall effect method

Autor: Maria-Louise Witthøft, Frederik W. Østerberg, Janusz Bogdanowicz, Rong Lin, Henrik H. Henrichsen, Ole Hansen, Dirch H. Petersen

Publikováno v: Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 2032-2039 (2018)

Hall effect metrology is important for a detailed characterization of the electronic properties of new materials for nanoscale electronics. The micro-Hall effect (MHE) method, based on micro four-point probes, enables a fast characterization of ultra

Externí odkaz: https://doaj.org/article/9925878a02544c3ca0e0b1eaafbea23f

Determination of thermoelectric properties from micro four-point probe measurements

Autor: Benny Guralnik, Ole Hansen, Andreas R Stilling-Andersen, Søren E Hansen, Kasper A Borup, Besira M Mihiretie, Braulio Beltrán-Pitarch, Henrik H Henrichsen, Rong Lin, Lior Shiv, Bo B Iversen, Peter F Nielsen, Dirch H Petersen

Publikováno v: Guralnik, B, Hansen, O, Stilling-Andersen, A R, Hansen, S E, Borup, K, Mihiretie, B M, Beltrán-Pitarch, B, Henrichsen, H H, Lin, R, Shiv, L, Iversen, B B, Nielsen, P F & Petersen, D H 2022, ' Determination of thermoelectric properties from micro four-point probe measurements ', Measurement Science and Technology, vol. 33, no. 12, 125001 . https://doi.org/10.1088/1361-6501/ac88ea
Guralnik, B, Hansen, O, Stilling-Andersen, A R, Hansen, S E, Borup, K A, Mihiretie, B M, Beltrán-Pitarch, B, Henrichsen, H H, Lin, R, Shiv, L, Iversen, B B, Nielsen, P F & Petersen, D H 2022, ' Determination of thermoelectric properties from micro four-point probe measurements ', Measurement Science and Technology, vol. 33, no. 12, 125001 . https://doi.org/10.1088/1361-6501/ac88ea

Micro four-point probing is a branch of electrical metrology where electrical (and electromagnetic) properties of charge carriers such as conductance, mobility, and tunneling magnetoresistance can be accurately and precisely determined at the μm sca

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3f70765cbdff6f0f4061eb149dc5e907
https://pure.au.dk/portal/da/publications/determination-of-thermoelectric-properties-from-micro-fourpoint-probe-measurements(3824d440-3043-4dd8-aa46-0d2f731fa485).html

Determination of thermal diffusivity of thermoelectric materials using a micro four-point probe method

Autor: Braulio Beltrán-Pitarch, Benny Guralnik, Neetu Lamba, Andreas R. Stilling-Andersen, Lars Nørregaard, Torben M. Hansen, Ole Hansen, Nini Pryds, Peter F. Nielsen, Dirch H. Petersen

Publikováno v: Beltrán-Pitarch, B, Guralnik, B, Lamba, N, Stilling-Andersen, A R, Nørregaard, L, Hansen, T M, Hansen, O, Pryds, N, Nielsen, P F & Petersen, D H 2023, ' Determination of thermal diffusivity of thermoelectric materials using a micro four-point probe method ', Materials Today Physics, vol. 31, 100963 . https://doi.org/10.1016/j.mtphys.2022.100963

To develop materials with higher thermoelectric efficiency, a comprehensive characterization of material properties on the relevant spatial scales is pertinent. In this study, we develop a new method based on a micro four-point probe (M4PP) to determ

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::15d808360ad8a4bd447e43144ee24325
https://doi.org/10.1016/j.mtphys.2022.100963

In-Line Resistance Measurement of Single Nanometer-Wide Trenches and Fins

Autor: Janusz Bogdanowicz, Brigitte Parmentier, Andreas Schulze, Alain Moussa, Clement Merckling, Bernardette Kunert, Weiming Guo, Yves Mols, Clement Porret, Erik Rosseel, Andriy Yakovitch Hikavyy, Ole Hansen, Dirch H. Petersen, Henrik H. Henrichsen, Peter F. Nielsen, Wilfried Vandervorst

Publikováno v: ECS Meeting Abstracts. :2008-2008

Since the advent of non-planar metal-oxide-semiconductor (MOS) transistors, embodied by the three-dimensional fin field-effect transistors (finFETs), there has been a rising need for fast in-line metrology solutions for the electrical characterizatio

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ca05298d06c51eb0075e987a9820bb00
https://doi.org/10.1149/ma2016-02/30/2008

Qualitative analysis of scanning gate microscopy on epitaxial graphene.

Autor: David M A Mackenzie, Vishal Panchal, Héctor Corte-León, Dirch H Petersen, Olga Kazakova

Publikováno v: 2D Materials; Apr2019, Vol. 6 Issue 2, p1-1, 1p