Zobrazeno 1 - 10
of 85
pro vyhledávání: '"Dipanjan Gope"'
Publikováno v:
IEEE Transactions on Plasma Science. 50:5018-5022
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff6132af5528e9d1f9a447e592ca0573
https://doi.org/10.1109/tps.2022.3225417
https://doi.org/10.1109/tps.2022.3225417
Publikováno v:
Journal of Electromagnetic Waves and Applications. 37:347-358
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::57f7ae08a27d0cbad88e7d8f5d0dd6c3
https://doi.org/10.1080/09205071.2022.2139198
https://doi.org/10.1080/09205071.2022.2139198
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 12:1204-1213
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b813abcb40e3d95ff6723c3d3ac35060
https://doi.org/10.1109/tcpmt.2022.3187716
https://doi.org/10.1109/tcpmt.2022.3187716
Publikováno v:
IEEE Transactions on Components, Packaging and Manufacturing Technology. 11:1391-1401
Modern high-performance server microprocessors need to integrate multiple intellectual property (IP) blocks in a single chip to achieve higher performance. Due to the diverse supply voltage requirements of these IP blocks, their supply voltages are g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ffe679e966112403ee37eed1c8f3a61a
https://doi.org/10.1109/tcpmt.2021.3098103
https://doi.org/10.1109/tcpmt.2021.3098103
Autor:
Jie Chen, Rajen Murugan, Sooping Saw, Francisco Lauzurique, John Broze, Craig Greenberg, Alex Triano, Bibhu Nayak, Harikiran Muniganti, Joe Sivaswamy, Dipanjan Gope
Publikováno v:
2022 IEEE 31st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d851d251b349b87521d15401dab079f0
https://doi.org/10.1109/epeps53828.2022.9947145
https://doi.org/10.1109/epeps53828.2022.9947145
Publikováno v:
IEEE Letters on Electromagnetic Compatibility Practice and Applications. 2:28-33
Electromagnetic Interference contributes to a significant percentage of failures in the verification stage of automotive electronics design cycle. Today these issues are caught late in the design cycle leading to delay in time-to-market. An effective
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::62649f0586d0eca4a04d69265566da21
https://doi.org/10.1109/lemcpa.2020.2979227
https://doi.org/10.1109/lemcpa.2020.2979227
Publikováno v:
IEEE Letters on Electromagnetic Compatibility Practice and Applications. 2:40-45
Radiated Emission is a critical issue affecting system-level performance of tightly packed electronic components. It contributes to a significant percentage of verification stage failures particularly in automotive electronics. Once the failure is de
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f0985ebfd87a3fa0d9ceb1fb215cec00
https://doi.org/10.1109/lemcpa.2020.2985342
https://doi.org/10.1109/lemcpa.2020.2985342
Publikováno v:
2021 43rd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC).
Asthma is an inflammatory disease of the airways which causes cough, chest tightness, wheezing and other distinct sounds during breathing. Spirometry is a golden standard lung function test, is used to monitor and diagnose asthma. Spirometry is very
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4952eab35513e6de5a7d8cfbfce5d3f0
https://doi.org/10.1109/embc46164.2021.9630802
https://doi.org/10.1109/embc46164.2021.9630802
Publikováno v:
MLSP
Spirometry is a lung function test used to diagnose and monitor lung diseases like asthma, pneumonia, chronic obstructive pulmonary disease, etc. Spirometry measures forced vital capacity (FVC), forced expiratory volume in 1 sec (FEV1), and their rat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::45ebc72fd44fab044eb5b0ae23d39521
https://doi.org/10.1109/mlsp52302.2021.9596159
https://doi.org/10.1109/mlsp52302.2021.9596159
Publikováno v:
2021 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC).
Conducted Emissions (CE) contributes to a significant percentage of compliance failures in the verification stage of electronic hardware. In this work, the effect of cable-bend on the CE results is studied. The cable bend at the LISN-end can affect t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e9264a447fea819bd4d52fd16ef99740
https://doi.org/10.1109/apemc49932.2021.9596715
https://doi.org/10.1109/apemc49932.2021.9596715